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An ultra-compact metasurface and specklemeter based chromatic confocal sensor

An ultra-compact metasurface and specklemeter based chromatic confocal sensor
An ultra-compact metasurface and specklemeter based chromatic confocal sensor

The development of ultracompact lightweight optical instrumentation that can be used on-machine and to carry out in-process measurements is vital in realizing improved manufacturing processes, increasing the quality of parts being made while saving time and energy by reducing scrappage rates. Only incremental progress is being made in developing suitable instrumentation based on conventional components, such as traditional refractive elements, as fundamental limits in terms of size and weight are already reached. Here, we demonstrate a chromatic confocal sensor that utilizes the natural chromatic aberration found with a basic hyperbolic metalens to realize an ultracompact and simple probe. Furthermore, we demonstrate how this can be combined with a compact specklemeter as the detection element, thus realizing the whole sensing system in a compact manner. Even with the proof-of-principle instrument in its preliminary and unoptimized state, we achieve the successful recovery of the location of a scatterer, as it is scanned over a 227 μm range, with a standard deviation of error in the position of 1.37 μm. Sensors of this form can be deployed in areas where traditional instrumentation would typically impede the manufacturing processes, increasing the number of processes that can have metrology applied directly and providing real-time feedback to improve manufacturing outcomes.

chromatic confocal sensors, laser-writing, metalens, scattering flat fiber, speckle patterns, laser writing, Chromatic confocal sensors
0018-9456
1-8
Falak, Przemyslaw Ludwik
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Ho-Tin Chan, Justin
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Williamson, James
013aa177-1407-476d-bad1-aaa931c54ede
Henning, Andrew
ba7b16de-5e91-43fa-86e0-6b5ee6fe5a74
Lee, Timothy
beb3b88e-3e5a-4c3f-8636-bb6de8040fcc
Zahertar, Shahrzad
9e9db9c7-0e1e-4d50-99b8-af23e09ab6ae
Holmes, Christopher
16306bb8-8a46-4fd7-bb19-a146758e5263
Beresna, Martynas
a6dc062e-93c6-46a5-aeb3-8de332cdec7b
Martin, Haydn
b6fb27bd-bd74-4131-be6d-979081c570fd
Brambilla, Gilberto
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Jiang, Xiangqian
9b2d5f21-a36d-4bd0-90ec-62160cb531df
Falak, Przemyslaw Ludwik
f414a5d1-34e8-429d-8f9a-f203b6d83324
Ho-Tin Chan, Justin
2f2f6f73-b94c-4400-a1f2-b56a0a1e2124
Williamson, James
013aa177-1407-476d-bad1-aaa931c54ede
Henning, Andrew
ba7b16de-5e91-43fa-86e0-6b5ee6fe5a74
Lee, Timothy
beb3b88e-3e5a-4c3f-8636-bb6de8040fcc
Zahertar, Shahrzad
9e9db9c7-0e1e-4d50-99b8-af23e09ab6ae
Holmes, Christopher
16306bb8-8a46-4fd7-bb19-a146758e5263
Beresna, Martynas
a6dc062e-93c6-46a5-aeb3-8de332cdec7b
Martin, Haydn
b6fb27bd-bd74-4131-be6d-979081c570fd
Brambilla, Gilberto
815d9712-62c7-47d1-8860-9451a363a6c8
Jiang, Xiangqian
9b2d5f21-a36d-4bd0-90ec-62160cb531df

Falak, Przemyslaw Ludwik, Ho-Tin Chan, Justin, Williamson, James, Henning, Andrew, Lee, Timothy, Zahertar, Shahrzad, Holmes, Christopher, Beresna, Martynas, Martin, Haydn, Brambilla, Gilberto and Jiang, Xiangqian (2024) An ultra-compact metasurface and specklemeter based chromatic confocal sensor. IEEE Transactions on Instrumentation and Measurement, 73, 1-8, [5016208]. (doi:10.1109/TIM.2024.3381698).

Record type: Article

Abstract

The development of ultracompact lightweight optical instrumentation that can be used on-machine and to carry out in-process measurements is vital in realizing improved manufacturing processes, increasing the quality of parts being made while saving time and energy by reducing scrappage rates. Only incremental progress is being made in developing suitable instrumentation based on conventional components, such as traditional refractive elements, as fundamental limits in terms of size and weight are already reached. Here, we demonstrate a chromatic confocal sensor that utilizes the natural chromatic aberration found with a basic hyperbolic metalens to realize an ultracompact and simple probe. Furthermore, we demonstrate how this can be combined with a compact specklemeter as the detection element, thus realizing the whole sensing system in a compact manner. Even with the proof-of-principle instrument in its preliminary and unoptimized state, we achieve the successful recovery of the location of a scatterer, as it is scanned over a 227 μm range, with a standard deviation of error in the position of 1.37 μm. Sensors of this form can be deployed in areas where traditional instrumentation would typically impede the manufacturing processes, increasing the number of processes that can have metrology applied directly and providing real-time feedback to improve manufacturing outcomes.

Text
P _Falak_IEEE_Transactions_Journal_Accepted_Pure_Version - Accepted Manuscript
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More information

Published date: 26 March 2024
Additional Information: Publisher Copyright: © 1963-2012 IEEE.
Keywords: chromatic confocal sensors, laser-writing, metalens, scattering flat fiber, speckle patterns, laser writing, Chromatic confocal sensors

Identifiers

Local EPrints ID: 488687
URI: http://eprints.soton.ac.uk/id/eprint/488687
ISSN: 0018-9456
PURE UUID: 0cfeb9c9-7655-4f2d-8363-6503c2c3d7a8
ORCID for Przemyslaw Ludwik Falak: ORCID iD orcid.org/0000-0002-2970-0700
ORCID for Timothy Lee: ORCID iD orcid.org/0000-0001-9665-5578
ORCID for Shahrzad Zahertar: ORCID iD orcid.org/0000-0001-6988-2345
ORCID for Christopher Holmes: ORCID iD orcid.org/0000-0001-9021-3760
ORCID for Gilberto Brambilla: ORCID iD orcid.org/0000-0002-5730-0499

Catalogue record

Date deposited: 04 Apr 2024 16:41
Last modified: 15 May 2024 02:02

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Contributors

Author: Przemyslaw Ludwik Falak ORCID iD
Author: Justin Ho-Tin Chan
Author: James Williamson
Author: Andrew Henning
Author: Timothy Lee ORCID iD
Author: Shahrzad Zahertar ORCID iD
Author: Martynas Beresna
Author: Haydn Martin
Author: Gilberto Brambilla ORCID iD
Author: Xiangqian Jiang

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