Fitting pseudo-Sérsic (Spergel) light profiles to galaxies in interferometric data: the excellence of the uυ-plane: The excellence of the uuvv-plane
Fitting pseudo-Sérsic (Spergel) light profiles to galaxies in interferometric data: the excellence of the uυ-plane: The excellence of the uuvv-plane
Modern (sub)millimeter interferometers, such as ALMA and NOEMA, offer high angular resolution and unprecedented sensitivity. This provides the possibility to characterize the morphology of the gas and dust in distant galaxies. To assess the capabilities of the current software in recovering morphologies and surface brightness profiles in interferometric observations, we tested the performance of the Spergel model for fitting in the uv-plane, which has been recently implemented in the IRAM software GILDAS (uv_fit). Spergel profiles provide an alternative to the Sérsic profile, with the advantage of having an analytical Fourier transform, making them ideal for modeling visibilities in the uv-plane. We provide an approximate conversion between the Spergel index and the Sérsic index, which depends on the ratio of the galaxy size to the angular resolution of the data. We show through extensive simulations that Spergel modeling in the uv-plane is a more reliable method for parameter estimation than modeling in the image plane, as it returns parameters that are less affected by systematic biases and results in a higher effective signal-to-noise ratio. The better performance in the uv-plane is likely driven by the difficulty of accounting for a correlated signal in interferometric images. Even in the uv-plane, the integrated source flux needs to be at least 50 times larger than the noise per beam to enable a reasonably good measurement of a Spergel index. We characterized the performance of Spergel model fitting in detail by showing that parameter biases are generally low (<10%) and that uncertainties returned by uv_fit are reliable within a factor of two. Finally, we showcase the power of Spergel fitting by reexamining two claims of extended halos around galaxies from the literature, showing that galaxies and halos can be successfully fitted simultaneously with a single Spergel model.
galaxies: high-redshift, methods: data analysis, submillimeter: galaxies, techniques: interferometric
Tan, Qing-Hua
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Daddi, Emanuele
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de Souza Magalhães, Victor
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Gómez-Guijarro, Carlos
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Pety, Jérôme
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Kalita, Boris S.
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Elbaz, David
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Liu, Zhaoxuan
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Magnelli, Benjamin
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Puglisi, Annagrazia
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Rujopakarn, Wiphu
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Silverman, John D.
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Valentino, Francesco
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Zhang, Shao-Bo
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1 April 2024
Tan, Qing-Hua
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Daddi, Emanuele
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de Souza Magalhães, Victor
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Gómez-Guijarro, Carlos
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Pety, Jérôme
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Kalita, Boris S.
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Elbaz, David
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Liu, Zhaoxuan
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Magnelli, Benjamin
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Puglisi, Annagrazia
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Rujopakarn, Wiphu
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Silverman, John D.
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Valentino, Francesco
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Zhang, Shao-Bo
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Tan, Qing-Hua, Daddi, Emanuele, de Souza Magalhães, Victor, Gómez-Guijarro, Carlos, Pety, Jérôme, Kalita, Boris S., Elbaz, David, Liu, Zhaoxuan, Magnelli, Benjamin, Puglisi, Annagrazia, Rujopakarn, Wiphu, Silverman, John D., Valentino, Francesco and Zhang, Shao-Bo
(2024)
Fitting pseudo-Sérsic (Spergel) light profiles to galaxies in interferometric data: the excellence of the uυ-plane: The excellence of the uuvv-plane.
Astronomy and Astrophysics, 684, [A23].
(doi:10.1051/0004-6361/202347255).
Abstract
Modern (sub)millimeter interferometers, such as ALMA and NOEMA, offer high angular resolution and unprecedented sensitivity. This provides the possibility to characterize the morphology of the gas and dust in distant galaxies. To assess the capabilities of the current software in recovering morphologies and surface brightness profiles in interferometric observations, we tested the performance of the Spergel model for fitting in the uv-plane, which has been recently implemented in the IRAM software GILDAS (uv_fit). Spergel profiles provide an alternative to the Sérsic profile, with the advantage of having an analytical Fourier transform, making them ideal for modeling visibilities in the uv-plane. We provide an approximate conversion between the Spergel index and the Sérsic index, which depends on the ratio of the galaxy size to the angular resolution of the data. We show through extensive simulations that Spergel modeling in the uv-plane is a more reliable method for parameter estimation than modeling in the image plane, as it returns parameters that are less affected by systematic biases and results in a higher effective signal-to-noise ratio. The better performance in the uv-plane is likely driven by the difficulty of accounting for a correlated signal in interferometric images. Even in the uv-plane, the integrated source flux needs to be at least 50 times larger than the noise per beam to enable a reasonably good measurement of a Spergel index. We characterized the performance of Spergel model fitting in detail by showing that parameter biases are generally low (<10%) and that uncertainties returned by uv_fit are reliable within a factor of two. Finally, we showcase the power of Spergel fitting by reexamining two claims of extended halos around galaxies from the literature, showing that galaxies and halos can be successfully fitted simultaneously with a single Spergel model.
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aa47255-23
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Accepted/In Press date: 7 December 2023
e-pub ahead of print date: 1 April 2024
Published date: 1 April 2024
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Publisher Copyright:
© The Authors 2024.
Keywords:
galaxies: high-redshift, methods: data analysis, submillimeter: galaxies, techniques: interferometric
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Local EPrints ID: 489250
URI: http://eprints.soton.ac.uk/id/eprint/489250
ISSN: 0004-6361
PURE UUID: f8b2b079-7753-4519-a694-2b021ba86eff
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Date deposited: 18 Apr 2024 16:45
Last modified: 20 May 2024 17:41
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Contributors
Author:
Qing-Hua Tan
Author:
Emanuele Daddi
Author:
Victor de Souza Magalhães
Author:
Carlos Gómez-Guijarro
Author:
Jérôme Pety
Author:
Boris S. Kalita
Author:
David Elbaz
Author:
Zhaoxuan Liu
Author:
Benjamin Magnelli
Author:
Annagrazia Puglisi
Author:
Wiphu Rujopakarn
Author:
John D. Silverman
Author:
Francesco Valentino
Author:
Shao-Bo Zhang
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