Topological optical metrology of nanoscale objects with sub-atomic resolution and a rate of one million frames per second
Topological optical metrology of nanoscale objects with sub-atomic resolution and a rate of one million frames per second
It is now well understood from the works on topology of light, that complex optical
fields (e.g. superoscillatory fields) can be structured at deeply subwavelength scales.
Point-like singularities, zones of energy back-flow and strong variations of phase and intensity can be orders of magnitude smaller than the wavelength. As such,
scattering of light on nanoscale objects can strongly depend on exactly where the
object is actually located in the structured field. This is the foundational idea of
metrology with topologically structured light.
Moreover, in localization metrology the use of artificial intelligence in the analysis of scattered light allows for instrumental fluctuations and drifts in the whole sample position to be distinguished from the displacements of the nanoscale object with respect to its immediate environment.
Furthermore, we demonstrate that ultrafast cameras allow atomic level metrology
with a rate of one million measurements per second which gives access to the
studies of dynamical processes such as driven or thermal motion in nanostructures.
Chi, Cheng-Hung
69d97711-d0d1-4e58-a19e-92599d7a4519
Grant, Thomas Alfred
a598fc1e-2e55-4fda-9c97-25514153d1f7
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Zheludev, Nikolay
32fb6af7-97e4-4d11-bca6-805745e40cc6
27 May 2024
Chi, Cheng-Hung
69d97711-d0d1-4e58-a19e-92599d7a4519
Grant, Thomas Alfred
a598fc1e-2e55-4fda-9c97-25514153d1f7
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Zheludev, Nikolay
32fb6af7-97e4-4d11-bca6-805745e40cc6
Chi, Cheng-Hung, Grant, Thomas Alfred, MacDonald, Kevin F. and Zheludev, Nikolay
(2024)
Topological optical metrology of nanoscale objects with sub-atomic resolution and a rate of one million frames per second.
2024 Spring Meeting of the European Materials Research Society, , Strasbourg, France.
27 - 31 May 2024.
1 pp
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
It is now well understood from the works on topology of light, that complex optical
fields (e.g. superoscillatory fields) can be structured at deeply subwavelength scales.
Point-like singularities, zones of energy back-flow and strong variations of phase and intensity can be orders of magnitude smaller than the wavelength. As such,
scattering of light on nanoscale objects can strongly depend on exactly where the
object is actually located in the structured field. This is the foundational idea of
metrology with topologically structured light.
Moreover, in localization metrology the use of artificial intelligence in the analysis of scattered light allows for instrumental fluctuations and drifts in the whole sample position to be distinguished from the displacements of the nanoscale object with respect to its immediate environment.
Furthermore, we demonstrate that ultrafast cameras allow atomic level metrology
with a rate of one million measurements per second which gives access to the
studies of dynamical processes such as driven or thermal motion in nanostructures.
Text
1mfps topological optical metrology
- Accepted Manuscript
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Published date: 27 May 2024
Venue - Dates:
2024 Spring Meeting of the European Materials Research Society, , Strasbourg, France, 2024-05-27 - 2024-05-31
Identifiers
Local EPrints ID: 489515
URI: http://eprints.soton.ac.uk/id/eprint/489515
PURE UUID: 1d20f428-9911-4552-a03e-ab128b6f958e
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Date deposited: 25 Apr 2024 16:44
Last modified: 27 May 2024 04:01
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Contributors
Author:
Cheng-Hung Chi
Author:
Thomas Alfred Grant
Author:
Kevin F. MacDonald
Author:
Nikolay Zheludev
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