READ ME File For 'Zinc oxide nanostructure deposition into sub-5 nm vertical mesopores in silica hard templates by atomic layer deposition'

Dataset DOI: 10.5258/SOTON/D3063

Date that the file was created: May, 2024

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GENERAL INFORMATION
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ReadMe Author: Tauqir Nasir, University of Southampton [https://orcid.org/0000-0003-0457-766X]

Date of data collection: 2021-2022

Information about geographic location of data collection: Southampton, London, UK.

Related projects: 
ADEPT

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SHARING/ACCESS INFORMATION
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Licenses/restrictions placed on the data, or limitations of reuse: open access

Recommended citation for the data:

This dataset supports the publication:
AUTHORS: Tauqir Nasir, Yisong Han, Chris Blackman, Richard Beanland, Andrew.L.Hector
TITLE: Zinc oxide nanostructure deposition into sub-5 nm vertical mesopores in silica hard templates by atomic layer deposition
JOURNAL: materials
PAPER DOI IF KNOWN:



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DATA & FILE OVERVIEW
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This dataset contains: Original data used to produce figures is provided in the text format files. These contain small angle X-ray scattering, electrochemical and X-ray diffraction results.


Figure 1. Cyclic voltammograms of 1 mmol dm−3 [Ru(NH3 )6 ]3+ in 0.1 M NaNO 3 on a bare ITO surface (black), MSF with surfactant inside the pores (red) and MSF after surfactant extraction from the pores (blue). Scan rate, 50 mV s−1.

Figure 2. In-plane GISAXS patterns (a) of MSF, ZnO 41 nm in MSF and ZnO 19 nm in MSF. The GISAXS patterns of (b) MSF, (c) ZnO 41 nm in MSF and (d) ZnO 19 nm in MSF. The incident angle used for the above patterns is 0.30°. 


Figure 3. The grazing incidence XRD spectra of MSF, ZnO in MSF 19 nm, ZnO in MSF 41 nm and ZnO (ICSD standard number 67848). The peaks in the MSF sample spectrum arise from ITO coating on the electrode surface.


Figure 4. SEM images of (a) ZnO in MSF 41 nm and (b) ZnO in MSF 19 nm. Images were obtained with a Zeiss Gemini SEM.



Figure 5. STEM image of ZnO in MSF 41 nm and elemental EDX maps recorded from the same area.The data images were obtained with a Jeol ARM 200-F TEM operated at 200 kV.


Figure 6. STEM image of ZnO in MSF 19 nm and EDX maps recorded from the TEM image. TEM images were obtained with a Jeol ARM 200-F TEM operated at 200 kV.


Figure 7. TEM bright- and dark-field images of (a,b) ZnO in MSF 41 nm and (c,d) ZnO in MSF 19 nm. TEM images were obtained with a Jeol ARM 200F operated at 200 kV.