Dataset supporting the publication "Solution-Processed Low Resistivity Zinc Oxide Nanoparticle Film with Enhanced Stability using EVOH"
Dataset supporting the publication "Solution-Processed Low Resistivity Zinc Oxide Nanoparticle Film with Enhanced Stability using EVOH"
This dataset supports the publication "Solution-processed low resistivity zinc oxide nanoparticle film with enhanced stability using EVOH", ACS Applied Electronic Material.
The dataset includes test results for Figure 4 that can be viewed in excel format.
The figures are as follows:
Figure 4. a) The resistance of interdigitated device without any passivation obtained after different UV-vacuum-heating times. The samples were exposed to the 365 nm wavelength UV and heated to 190 °C in 10-2 mbar vacuum condition.
Figure 5. Measured time dependent sheet resistance changes. The sheet resistance is calculated from the measured resistance of the device to its W/L ratio (See Figure S2e). The lines joining the dots are only for eye guide.
Figure 7. Measured O 1s XPS spectra of ZnO NP film, a) with EVOH passivation and UV-vacuum-heat process b) without the passivation and the UV-vacuum-heat process.
Related projects:
Royal Academy of Engineering under the Chairs in Emerging Technologies Scheme
University of Southampton
Qu, Mengyang
111ae526-7a41-4ec2-96ac-f04e29a00c99
Qu, Mengyang
111ae526-7a41-4ec2-96ac-f04e29a00c99
Qu, Mengyang
(2024)
Dataset supporting the publication "Solution-Processed Low Resistivity Zinc Oxide Nanoparticle Film with Enhanced Stability using EVOH".
University of Southampton
doi:10.5258/SOTON/D3069
[Dataset]
Abstract
This dataset supports the publication "Solution-processed low resistivity zinc oxide nanoparticle film with enhanced stability using EVOH", ACS Applied Electronic Material.
The dataset includes test results for Figure 4 that can be viewed in excel format.
The figures are as follows:
Figure 4. a) The resistance of interdigitated device without any passivation obtained after different UV-vacuum-heating times. The samples were exposed to the 365 nm wavelength UV and heated to 190 °C in 10-2 mbar vacuum condition.
Figure 5. Measured time dependent sheet resistance changes. The sheet resistance is calculated from the measured resistance of the device to its W/L ratio (See Figure S2e). The lines joining the dots are only for eye guide.
Figure 7. Measured O 1s XPS spectra of ZnO NP film, a) with EVOH passivation and UV-vacuum-heat process b) without the passivation and the UV-vacuum-heat process.
Related projects:
Royal Academy of Engineering under the Chairs in Emerging Technologies Scheme
Spreadsheet
Data_set.xlsx
- Dataset
Text
D3069-README.txt
- Dataset
More information
Published date: 2024
Identifiers
Local EPrints ID: 490225
URI: http://eprints.soton.ac.uk/id/eprint/490225
PURE UUID: 1793633a-c2eb-465d-8509-a62af911ca8a
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Date deposited: 20 May 2024 17:10
Last modified: 03 Jun 2024 01:58
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Contributors
Creator:
Mengyang Qu
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