Advanced electron microscopy: progress and application of electron backscatter diffraction
Advanced electron microscopy: progress and application of electron backscatter diffraction
Orientation microscopy based on electron backscatter diffraction (EBSD) is a powerful technique for the rapid and comprehensive characterization of crystalline materials. It covers a broad range of scale ranging from the micrometer to the centimeter. At the centimeter scale, EBSD is capable of statistical texture determination similar to X-ray techniques. At the micrometer scale EBSD can achieve a resolution close to that of conventional transmission electron microscope. This article provides an overview of the principles behind EBSD and its use as a technique to characterise deformed metals and complex microstructures.
Electron backscatter diffraction, Geometrically necessary dislocations, Hough transformation, Kikuchi pattern, Misorientation, Spatial and angular resolution
648-661
Gintalas, Marius
dd12a5ff-587e-44a6-b6c3-58127016cba0
Rivera-Díaz-del-Castillo, Pedro E.J.
6e0abc1c-2aee-4a18-badc-bac28e7831e2
Rivera-Diaz-del-Castillo, Pedro E.J.
1 September 2021
Gintalas, Marius
dd12a5ff-587e-44a6-b6c3-58127016cba0
Rivera-Díaz-del-Castillo, Pedro E.J.
6e0abc1c-2aee-4a18-badc-bac28e7831e2
Rivera-Diaz-del-Castillo, Pedro E.J.
Gintalas, Marius and Rivera-Díaz-del-Castillo, Pedro E.J.
(2021)
Advanced electron microscopy: progress and application of electron backscatter diffraction.
In,
Fu, Ming Wang and Rivera-Diaz-del-Castillo, Pedro E.J.
(eds.)
Encyclopedia of Materials: Metals and Alloys.
Elsevier, .
(doi:10.1016/B978-0-12-819726-4.00075-2).
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Book Section
Abstract
Orientation microscopy based on electron backscatter diffraction (EBSD) is a powerful technique for the rapid and comprehensive characterization of crystalline materials. It covers a broad range of scale ranging from the micrometer to the centimeter. At the centimeter scale, EBSD is capable of statistical texture determination similar to X-ray techniques. At the micrometer scale EBSD can achieve a resolution close to that of conventional transmission electron microscope. This article provides an overview of the principles behind EBSD and its use as a technique to characterise deformed metals and complex microstructures.
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Published date: 1 September 2021
Keywords:
Electron backscatter diffraction, Geometrically necessary dislocations, Hough transformation, Kikuchi pattern, Misorientation, Spatial and angular resolution
Identifiers
Local EPrints ID: 492240
URI: http://eprints.soton.ac.uk/id/eprint/492240
PURE UUID: d07b30b1-a4d1-4de8-bdb3-c5570c932a07
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Date deposited: 23 Jul 2024 16:32
Last modified: 24 Jul 2024 02:07
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Contributors
Author:
Marius Gintalas
Author:
Pedro E.J. Rivera-Díaz-del-Castillo
Editor:
Ming Wang Fu
Editor:
Pedro E.J. Rivera-Diaz-del-Castillo
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