Noise in reflex klystrons and backward-wave oscillators
Noise in reflex klystrons and backward-wave oscillators
The paper describes a.m. and f.m. direct-detection and superheterodyne noise spectrum measurements on various types of backward-wave oscillator and reflex klystron. A procedure has been developed by which the individual a.m., f.m. and background noise components can be separated. The results show that the predominant component at low sideband frequencies is f.m. noise and at high sideband frequencies is backround noise. The a.m. noise is not a significant component. The presence of positive ions in the beam of a backward-wave oscillator causes noise peaks at frequencies near 1 Mc/s and an increase in modulation noise over a wide frequency range. Positive ions can be relatively easily removed by transverse ion drainage. Large noise peaks may also be generated at frequecies near those of spurious oscillation. The results of measurements of carrier frequency deviation, and of correlation between a.m. and f.m. noise, and between modulation and beam noise are also given.
389-403
Bosch, B.G.
4259e801-c65f-40c2-bb0f-8176a1e83e32
Gambling, W.A.
70d15b3d-eaf7-44ed-9120-7ae47ba68324
November 1962
Bosch, B.G.
4259e801-c65f-40c2-bb0f-8176a1e83e32
Gambling, W.A.
70d15b3d-eaf7-44ed-9120-7ae47ba68324
Bosch, B.G. and Gambling, W.A.
(1962)
Noise in reflex klystrons and backward-wave oscillators.
Journal of the British Institution of Radio Engineers, 24 (5), .
(doi:10.1049/jbire.1962.0115).
Abstract
The paper describes a.m. and f.m. direct-detection and superheterodyne noise spectrum measurements on various types of backward-wave oscillator and reflex klystron. A procedure has been developed by which the individual a.m., f.m. and background noise components can be separated. The results show that the predominant component at low sideband frequencies is f.m. noise and at high sideband frequencies is backround noise. The a.m. noise is not a significant component. The presence of positive ions in the beam of a backward-wave oscillator causes noise peaks at frequencies near 1 Mc/s and an increase in modulation noise over a wide frequency range. Positive ions can be relatively easily removed by transverse ion drainage. Large noise peaks may also be generated at frequecies near those of spurious oscillation. The results of measurements of carrier frequency deviation, and of correlation between a.m. and f.m. noise, and between modulation and beam noise are also given.
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Published date: November 1962
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Local EPrints ID: 495041
URI: http://eprints.soton.ac.uk/id/eprint/495041
PURE UUID: 271de40c-b444-401a-a6d0-4023be35569e
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Date deposited: 28 Oct 2024 17:47
Last modified: 28 Oct 2024 17:47
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Author:
B.G. Bosch
Author:
W.A. Gambling
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