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Laser-induced electron diffraction in the over-the-barrier-ionization regime

Laser-induced electron diffraction in the over-the-barrier-ionization regime
Laser-induced electron diffraction in the over-the-barrier-ionization regime

Large polyatomic molecules typically exhibit low ionization potentials, Ip, leading to over-the-barrier ionization (OBI) already at relatively low intensities (∼1013 W/cm2). We revisit laser-induced electron diffraction (LIED) in the over-the-barrier-ionization (OBI) regime and answer the question of whether imaging of molecular structure is still possible with LIED. We employ a hydrogenlike model system mimicking a molecule with low Ip using a classical trajectory-based model that incorporates the Coulomb potential; we also use the numerical solution to the time-dependent Schrödinger equation. Specifically, we adopt the Fourier transform variant of LIED to show that even a significant contribution of short trajectories in the OBI regime does not preclude structure retrieval from strong-field diffractive patterns. This theoretical investigation shows that LIED can be well described by the classical recollision model even when ionization occurs within the OBI regime. This study paves the way towards strong-field imaging of chemical transformations of large polyatomic molecules in real time based on strong-field electron recollision.

Theoretical physics, Theoretical Chemistry, atomic processes, ultrafast phenomena, electron scattering, ionization
2469-9926
Belsa, B.
69f9d569-9681-4f20-bb43-0726a55a0918
Ziems, K. M.
6d346238-2471-47c7-b89f-590059caf037
Sanchez, A.
1b31a2de-40a8-404e-8222-d9bbcf7a3136
Chirvi, K.
0c7d2818-6fb4-477f-ae6c-248df6844ff0
Liu, X.
1cefe910-964c-48a7-a55f-a056da5d33ad
Gräfe, S.
32b99c66-1736-44b1-9a25-aafd5991dbae
Biegert, J.
cacbe65c-bc2e-4f91-b83d-5cd23a690537
Belsa, B.
69f9d569-9681-4f20-bb43-0726a55a0918
Ziems, K. M.
6d346238-2471-47c7-b89f-590059caf037
Sanchez, A.
1b31a2de-40a8-404e-8222-d9bbcf7a3136
Chirvi, K.
0c7d2818-6fb4-477f-ae6c-248df6844ff0
Liu, X.
1cefe910-964c-48a7-a55f-a056da5d33ad
Gräfe, S.
32b99c66-1736-44b1-9a25-aafd5991dbae
Biegert, J.
cacbe65c-bc2e-4f91-b83d-5cd23a690537

Belsa, B., Ziems, K. M., Sanchez, A., Chirvi, K., Liu, X., Gräfe, S. and Biegert, J. (2022) Laser-induced electron diffraction in the over-the-barrier-ionization regime. Physical Review A, 106 (4), [043105]. (doi:10.1103/PhysRevA.106.043105).

Record type: Article

Abstract

Large polyatomic molecules typically exhibit low ionization potentials, Ip, leading to over-the-barrier ionization (OBI) already at relatively low intensities (∼1013 W/cm2). We revisit laser-induced electron diffraction (LIED) in the over-the-barrier-ionization (OBI) regime and answer the question of whether imaging of molecular structure is still possible with LIED. We employ a hydrogenlike model system mimicking a molecule with low Ip using a classical trajectory-based model that incorporates the Coulomb potential; we also use the numerical solution to the time-dependent Schrödinger equation. Specifically, we adopt the Fourier transform variant of LIED to show that even a significant contribution of short trajectories in the OBI regime does not preclude structure retrieval from strong-field diffractive patterns. This theoretical investigation shows that LIED can be well described by the classical recollision model even when ionization occurs within the OBI regime. This study paves the way towards strong-field imaging of chemical transformations of large polyatomic molecules in real time based on strong-field electron recollision.

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More information

Published date: 11 October 2022
Additional Information: Publisher Copyright: © 2022 American Physical Society.
Keywords: Theoretical physics, Theoretical Chemistry, atomic processes, ultrafast phenomena, electron scattering, ionization

Identifiers

Local EPrints ID: 498203
URI: http://eprints.soton.ac.uk/id/eprint/498203
ISSN: 2469-9926
PURE UUID: c868eadb-98ae-4be0-a9df-3c15d6bdcca6
ORCID for K. M. Ziems: ORCID iD orcid.org/0000-0001-5369-7778

Catalogue record

Date deposited: 12 Feb 2025 17:44
Last modified: 13 Feb 2025 03:16

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Contributors

Author: B. Belsa
Author: K. M. Ziems ORCID iD
Author: A. Sanchez
Author: K. Chirvi
Author: X. Liu
Author: S. Gräfe
Author: J. Biegert

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