Photovoltaic connector behaviour finder accelerated fretting testing regimes
Photovoltaic connector behaviour finder accelerated fretting testing regimes
Photovoltaic modules have no moving parts and last upwards of 25 years with no maintenance aside from the occasional cleaning. The installation of modules in building facades and other structures has necessitated the use of push fit connectors to enable quick and easy inter-module dc electrical connection. New applications for photovoltaics such as roof shingles (tiles) place further performance demands on connectors. The day-night variation in temperature within a PV roof for example, creates expansion of components. This paper details the behaviour of a tin plated copper, photovoltaic connector under small amplitude fretting tests (10-100 μm) using a specially developed accelerated lifetime test rig. The mated connector creates a high force, multiple point contact between the male and female components by the use of a prestressed spring collar. The study shows that a transition amplitude exists (∼13 μm) above which gross slip at the connector interface appears to occur. This causes a gradual, linear increase in contact resistance, followed by a sudden change to rapid wearing of the tin plating on both the connector surfaces and spring collar, leading to connector failure. Below the transition amplitude, partial slip at the connector interface is observed which creates a stable, low contact resistance. The paper highlights the need to maintain a partial slip / stick condition within a PV connector for long term contact resistance stability. The implication of this requirement to photovoltaic connector design and application is discussed, considering the benefit of flexible connector housings and lubricants in particular.
203-208
Bahaj, A. B.
a64074cc-2b6e-43df-adac-a8437e7f1b37
James, P.
da0be14a-aa63-46a7-8646-a37f9a02a71b
McBride, J.
d9429c29-9361-4747-9ba3-376297cb8770
2001
Bahaj, A. B.
a64074cc-2b6e-43df-adac-a8437e7f1b37
James, P.
da0be14a-aa63-46a7-8646-a37f9a02a71b
McBride, J.
d9429c29-9361-4747-9ba3-376297cb8770
Bahaj, A. B., James, P. and McBride, J.
(2001)
Photovoltaic connector behaviour finder accelerated fretting testing regimes.
In Electrical Contacts: Proceedings of the Annual Holm Conference on Electrical Contacts.
IEEE.
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
Photovoltaic modules have no moving parts and last upwards of 25 years with no maintenance aside from the occasional cleaning. The installation of modules in building facades and other structures has necessitated the use of push fit connectors to enable quick and easy inter-module dc electrical connection. New applications for photovoltaics such as roof shingles (tiles) place further performance demands on connectors. The day-night variation in temperature within a PV roof for example, creates expansion of components. This paper details the behaviour of a tin plated copper, photovoltaic connector under small amplitude fretting tests (10-100 μm) using a specially developed accelerated lifetime test rig. The mated connector creates a high force, multiple point contact between the male and female components by the use of a prestressed spring collar. The study shows that a transition amplitude exists (∼13 μm) above which gross slip at the connector interface appears to occur. This causes a gradual, linear increase in contact resistance, followed by a sudden change to rapid wearing of the tin plating on both the connector surfaces and spring collar, leading to connector failure. Below the transition amplitude, partial slip at the connector interface is observed which creates a stable, low contact resistance. The paper highlights the need to maintain a partial slip / stick condition within a PV connector for long term contact resistance stability. The implication of this requirement to photovoltaic connector design and application is discussed, considering the benefit of flexible connector housings and lubricants in particular.
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More information
Published date: 2001
Venue - Dates:
47th IEEE Holm Conference on Electrical Contacts, , Montreal, Que., Canada, 2001-09-10 - 2001-09-12
Identifiers
Local EPrints ID: 499026
URI: http://eprints.soton.ac.uk/id/eprint/499026
ISSN: 0361-4395
PURE UUID: c762d011-e192-4050-82db-cb124deef2ea
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Date deposited: 07 Mar 2025 17:34
Last modified: 08 Mar 2025 02:34
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