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Ultra-thin silicon solar cell: modelling and characterisation

Ultra-thin silicon solar cell: modelling and characterisation
Ultra-thin silicon solar cell: modelling and characterisation
An ultra-thin crystalline silicon solar cell with an active silicon layer of 200 nm has been fabricated and fully characterised electrically (I-V characteristic, spectral response) and optically (Variable Angle Spectroscopic Ellipsometry). Interference effects were observed in the spectral response of the cell due to multiple reflections from the layers within the cell. A mathematical model was developed to account for the different reflections and transmission within the cell which reproduced excellently the essential features of the experimental spectral response.
1610-1634
1407-1410
Danos, L.
c831e137-37b9-42cc-ab8c-49de31038922
Jones, G.
6f771ff0-5f71-4709-be07-8bcf83871a7c
Greef, R.
91063544-ed89-4738-b5f4-28a984bf5866
Markvart, T.
f21e82ec-4e3b-4485-9f27-ffc0102fdf1c
Danos, L.
c831e137-37b9-42cc-ab8c-49de31038922
Jones, G.
6f771ff0-5f71-4709-be07-8bcf83871a7c
Greef, R.
91063544-ed89-4738-b5f4-28a984bf5866
Markvart, T.
f21e82ec-4e3b-4485-9f27-ffc0102fdf1c

Danos, L., Jones, G., Greef, R. and Markvart, T. (2008) Ultra-thin silicon solar cell: modelling and characterisation. Physica Status Solidi (c), 5 (5), 1407-1410. (doi:10.1002/pssc.200777809).

Record type: Article

Abstract

An ultra-thin crystalline silicon solar cell with an active silicon layer of 200 nm has been fabricated and fully characterised electrically (I-V characteristic, spectral response) and optically (Variable Angle Spectroscopic Ellipsometry). Interference effects were observed in the spectral response of the cell due to multiple reflections from the layers within the cell. A mathematical model was developed to account for the different reflections and transmission within the cell which reproduced excellently the essential features of the experimental spectral response.

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More information

Published date: 2008
Organisations: Engineering Mats & Surface Engineerg Gp

Identifiers

Local EPrints ID: 49973
URI: http://eprints.soton.ac.uk/id/eprint/49973
ISSN: 1610-1634
PURE UUID: bae4544f-8541-446c-9209-619b5a39ef41

Catalogue record

Date deposited: 15 Apr 2008
Last modified: 15 Mar 2024 10:01

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Contributors

Author: L. Danos
Author: G. Jones
Author: R. Greef
Author: T. Markvart

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