Controlling the information flow in optical metrology with plasmonics
Controlling the information flow in optical metrology with plasmonics
Chi, Cheng-Hung
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Grant, Thomas A.
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MacDonald, Kevin F.
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Neubacher, Luca
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Rotter, S.
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Weimar, Maximilian
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Zhou, Huanli
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Zheludev, Nikolay I.
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5 November 2025
Chi, Cheng-Hung
69d97711-d0d1-4e58-a19e-92599d7a4519
Grant, Thomas A.
a598fc1e-2e55-4fda-9c97-25514153d1f7
MacDonald, Kevin F.
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Neubacher, Luca
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Rotter, S.
95ffd854-34c1-4fc0-b854-37a364305080
Weimar, Maximilian
2ba34eab-f0a3-4304-8eec-4c0943152839
Zhou, Huanli
3279926e-2262-4d0b-9fd0-3769e5d64a03
Zheludev, Nikolay I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
Chi, Cheng-Hung, Grant, Thomas A., MacDonald, Kevin F., Neubacher, Luca, Rotter, S., Weimar, Maximilian, Zhou, Huanli and Zheludev, Nikolay I.
(2025)
Controlling the information flow in optical metrology with plasmonics.
Photonics and Electromagnetics Research Symposium 2025, , Chiba, Japan.
05 - 09 Nov 2025.
1 pp
.
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Conference or Workshop Item
(Paper)
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Published date: 5 November 2025
Venue - Dates:
Photonics and Electromagnetics Research Symposium 2025, , Chiba, Japan, 2025-11-05 - 2025-11-09
Identifiers
Local EPrints ID: 503179
URI: http://eprints.soton.ac.uk/id/eprint/503179
PURE UUID: 970bf6c1-ce34-4f81-9f41-688bff02a570
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Date deposited: 23 Jul 2025 16:38
Last modified: 01 Oct 2025 01:38
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Contributors
Author:
Cheng-Hung Chi
Author:
Thomas A. Grant
Author:
Kevin F. MacDonald
Author:
Luca Neubacher
Author:
S. Rotter
Author:
Maximilian Weimar
Author:
Huanli Zhou
Author:
Nikolay I. Zheludev
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