Spatial resolution improvement of 450 kV computed tomography via vertical subpixel detector shifting
Spatial resolution improvement of 450 kV computed tomography via vertical subpixel detector shifting
X-ray sources with acceleration voltages of 450 kV typically have large focal spot sizes that lead to low spatial resolution computed tomography (CT) data. In this work a method to improve the spatial resolution of 450 kV CT is developed. The proposed method relies on using vertical subpixel detector shifting and deconvolution to generate a projection-set that has double the number of pixels in the direction parallel to the axis of rotation. The results show that the proposed method is able to increase the 10% modulation transfer function of the considered system from 3 lp/mm to 4 lp/mm. In addition, a scan of a metal additively manufactured component with periodic features of approximately 200 μm is used to demonstrate the method; small features that were not fully resolved in a conventional scan become resolvable when the proposed method is used.
metal additive manufacturing, X-ray computed tomography, 450 kV XCT
219-230
Lifton, Joseph
9be501ec-2742-4ab6-8a5a-996c5b7c23ae
Liu, Tong
17f1a70b-449d-4078-af64-957a5b374698
9 April 2020
Lifton, Joseph
9be501ec-2742-4ab6-8a5a-996c5b7c23ae
Liu, Tong
17f1a70b-449d-4078-af64-957a5b374698
Lifton, Joseph and Liu, Tong
(2020)
Spatial resolution improvement of 450 kV computed tomography via vertical subpixel detector shifting.
Journal of X-Ray Science and Technology, 28 (2), .
(doi:10.3233/XST-190595).
Abstract
X-ray sources with acceleration voltages of 450 kV typically have large focal spot sizes that lead to low spatial resolution computed tomography (CT) data. In this work a method to improve the spatial resolution of 450 kV CT is developed. The proposed method relies on using vertical subpixel detector shifting and deconvolution to generate a projection-set that has double the number of pixels in the direction parallel to the axis of rotation. The results show that the proposed method is able to increase the 10% modulation transfer function of the considered system from 3 lp/mm to 4 lp/mm. In addition, a scan of a metal additively manufactured component with periodic features of approximately 200 μm is used to demonstrate the method; small features that were not fully resolved in a conventional scan become resolvable when the proposed method is used.
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More information
Accepted/In Press date: 21 December 2019
e-pub ahead of print date: 22 January 2020
Published date: 9 April 2020
Keywords:
metal additive manufacturing, X-ray computed tomography, 450 kV XCT
Identifiers
Local EPrints ID: 507716
URI: http://eprints.soton.ac.uk/id/eprint/507716
ISSN: 0895-3996
PURE UUID: 3e805481-b15e-4d80-b4c9-ddfc19c614f8
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Date deposited: 19 Dec 2025 18:12
Last modified: 20 Dec 2025 03:48
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Author:
Joseph Lifton
Author:
Tong Liu
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