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Shear deformation and texture evolution in Al alloys processed for one pass by ECAP

Record type: Article

The evolution of texture and deformation in the grains during one pass of equal-channel angular pressing (ECAP) was examined for fine grained high strength and low strength Al alloys and a coarse grained low strength Al alloy. The materials were analysed using electron back-scatter diffraction (EBSD). The results are consistent with the materials responding to the intense macroscopic shear stress by deformation of individual grains through movement of dislocations on one or more of the slip crystallographic slip planes {hkl} that are favourably oriented, combined with the rotation of grains to directions that bring main crystallographic slip planes parallel to the macroscopic shear direction and crystallographic slip directions <uvw> parallel to the main shear direction. Contrary to reports claiming up to 4 slip systems are activated, it was observed that only the {111}<110> and {001}<110> shear systems are activated. Macroscopic shear deformation occurs on two shear planes: the main shear plane (MSP), equivalent to the simple shear plane, and a secondary shear plane which is perpendicular to the MSP.

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Citation

Starink, Marco J., Wang, Shun Cai, Qiao, Xiao Guang, Gao, Nong, Roven, Hans J. and Langdon, Terence G. (2008) Shear deformation and texture evolution in Al alloys processed for one pass by ECAP Materials Science Forum, 584-586, pp. 679-684.

More information

Published date: 2008
Keywords: ECAP, SPD, texture, deformation, secondary shear plane, shear, slip system, 111 slip, cube slip, EBSD, pole figure, OIM, UFG, AA1050, AA7xxx, DSC
Organisations: Engineering Mats & Surface Engineerg Gp

Identifiers

Local EPrints ID: 50782
URI: http://eprints.soton.ac.uk/id/eprint/50782
ISSN: 1662-9752
PURE UUID: 9bd663ac-7335-4bba-87e6-b4aa90e95d2d
ORCID for Terence G. Langdon: ORCID iD orcid.org/0000-0003-3541-9250

Catalogue record

Date deposited: 28 Mar 2008
Last modified: 17 Jul 2017 14:50

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Contributors

Author: Shun Cai Wang
Author: Xiao Guang Qiao
Author: Nong Gao
Author: Hans J. Roven

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