Achieving atomic-scale precision in optical metrology by engineering the object environment
Achieving atomic-scale precision in optical metrology by engineering the object environment
Grant, Thomas A.
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Chi, Cheng-Hung
69d97711-d0d1-4e58-a19e-92599d7a4519
MacDonald, Kevin F.
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Zheludev, Nikolay I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
12 July 2026
Grant, Thomas A.
0a8fdda7-92d0-475f-809b-4784b81f9b24
Chi, Cheng-Hung
69d97711-d0d1-4e58-a19e-92599d7a4519
MacDonald, Kevin F.
76c84116-aad1-4973-b917-7ca63935dba5
Zheludev, Nikolay I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
Grant, Thomas A., Chi, Cheng-Hung, MacDonald, Kevin F. and Zheludev, Nikolay I.
(2026)
Achieving atomic-scale precision in optical metrology by engineering the object environment.
Optica ImageSense Congress, , Maastricht, Netherlands.
12 - 17 Jul 2026.
2 pp
.
Record type:
Conference or Workshop Item
(Paper)
Text
information optimisation
- Accepted Manuscript
Restricted to Repository staff only until 12 July 2026.
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Published date: 12 July 2026
Venue - Dates:
Optica ImageSense Congress, , Maastricht, Netherlands, 2026-07-12 - 2026-07-17
Identifiers
Local EPrints ID: 511393
URI: http://eprints.soton.ac.uk/id/eprint/511393
PURE UUID: f6ecde07-0da0-4d0d-abb9-90add22809a7
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Date deposited: 13 May 2026 16:52
Last modified: 14 May 2026 01:36
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Contributors
Author:
Thomas A. Grant
Author:
Cheng-Hung Chi
Author:
Kevin F. MacDonald
Author:
Nikolay I. Zheludev
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