MacDonald, Kevin F. and Zheludev, Nikolay (2026) Atomic-scale precision in optical scattering metrology. Metrology and Properties of Surfaces 2026, , London, United Kingdom. 14 - 16 Jul 2026. 1 pp .
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Conference or Workshop Item
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Text
metrology of nanoscale objects
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Restricted to Repository staff only until 14 July 2026.
Available under License Creative Commons Attribution.
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Published date: 14 July 2026
Venue - Dates:
Metrology and Properties of Surfaces 2026, , London, United Kingdom, 2026-07-14 - 2026-07-16
Identifiers
Local EPrints ID: 511767
URI: http://eprints.soton.ac.uk/id/eprint/511767
PURE UUID: feef4e78-21e8-4061-8642-0a0d101f533f
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Date deposited: 01 Jun 2026 16:57
Last modified: 02 Jun 2026 01:36
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Contributors
Author:
Kevin F. MacDonald
Author:
Nikolay Zheludev
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