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Electron back-scattering patterns in a field emission gun scanning electron microscope

Electron back-scattering patterns in a field emission gun scanning electron microscope
Electron back-scattering patterns in a field emission gun scanning electron microscope
564-565
Microscopical Society of Canada
Harland, C.J.
8d18cf67-fcbd-4802-ac16-207e694b562e
Klein, J.H.
639e04f0-059a-4566-9361-a4edda0dba7d
Akhter, P.
c4eb65f5-22e9-4795-bb97-758af3da1aea
Venables, J.A.
830cb9ea-0d39-47a6-8e28-02c8b2e34db8
Sturgess, J.M.
Harland, C.J.
8d18cf67-fcbd-4802-ac16-207e694b562e
Klein, J.H.
639e04f0-059a-4566-9361-a4edda0dba7d
Akhter, P.
c4eb65f5-22e9-4795-bb97-758af3da1aea
Venables, J.A.
830cb9ea-0d39-47a6-8e28-02c8b2e34db8
Sturgess, J.M.

Harland, C.J., Klein, J.H., Akhter, P. and Venables, J.A. (1978) Electron back-scattering patterns in a field emission gun scanning electron microscope. Sturgess, J.M. (ed.) In Proceedings of the 9th International Congress on Electron Microscopy. Microscopical Society of Canada. pp. 564-565 . (Submitted)

Record type: Conference or Workshop Item (Paper)

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More information

Submitted date: August 1978
Venue - Dates: 9th International Congress on Electron Microscopy, Toronto, Canada, 1978-08-01 - 1978-08-09

Identifiers

Local EPrints ID: 51332
URI: http://eprints.soton.ac.uk/id/eprint/51332
PURE UUID: e4564927-592e-4733-86b3-be7f3c49eeb8
ORCID for J.H. Klein: ORCID iD orcid.org/0000-0002-5495-8738

Catalogue record

Date deposited: 27 Apr 2009
Last modified: 29 Oct 2022 01:32

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Contributors

Author: C.J. Harland
Author: J.H. Klein ORCID iD
Author: P. Akhter
Author: J.A. Venables
Editor: J.M. Sturgess

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