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Nanophotonics under the electron microscope

MacDonald, K.F., Denisyuk, A.I., Jonsson, F., Soares, B.F., Bashevoy, M.V. and Zheludev, N.I. (2008) Nanophotonics under the electron microscope At 6th International Workshop on Nanophotonics. 11 Mar 2008.

Record type: Conference or Workshop Item (Paper)

Abstract

The scanning electron microscope (SEM) provides an excellent environment for nanophotonics research, as the electron beam can be used not only for imaging, but also for nanoscale excitation and probing of samples. This talk will review recent studies of optical memory and switching functionalities in gallium nanoparticles performed in an SEM environment.Most recently, it has been found that the phase state of bistable gallium nanoparticles, controlled by optical or electron beam excitations, can be identified via measurements of their cathodoluminescent emission, thus offering an innovative conceptual basis for the development of high density non-volatile phase-change memories. Changes of up to 20% in visible emission intensity are observed following low-fluence optical or electron beam induced phase switching in a monolayer of 60 nm particles.

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More information

Submitted date: March 2008
Venue - Dates: 6th International Workshop on Nanophotonics, 2008-03-11 - 2008-03-11

Identifiers

Local EPrints ID: 54016
URI: http://eprints.soton.ac.uk/id/eprint/54016
PURE UUID: 24da92ad-e434-4eca-9b24-dfe9820090e5
ORCID for K.F. MacDonald: ORCID iD orcid.org/0000-0002-3877-2976

Catalogue record

Date deposited: 21 Aug 2008
Last modified: 17 Jul 2017 14:36

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Contributors

Author: K.F. MacDonald ORCID iD
Author: A.I. Denisyuk
Author: F. Jonsson
Author: B.F. Soares
Author: M.V. Bashevoy
Author: N.I. Zheludev

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