Electron tomography of heterogeneous catalysts
Electron tomography of heterogeneous catalysts
EMAG conferences are biennial events organised by the Electron Microscopy and Analysis Group of the Institute of Physics. The aim of the EMAG conference series is to provide a forum for discussion of the latest developments in instrumentation, techniques and applications of electron and scanning probe microscopies. EMAG 2003, the latest conference in this series, was held at the University of Oxford in September 2003. Electron microscopy is now a mainstay characterisation tool for solid state physicists and chemists as well as materials scientists. This volume is intended as a reference covering current developments in this field mainly in the UK but also further afield.
resolution, microscopy
9780750309677
459-462
Laffont, L.M.
38633fd3-1ddb-45c0-a157-f0c4f0b7e563
Raja, R.
74faf442-38a6-4ac1-84f9-b3c039cb392b
Thomas, J.M.
98879775-7bc8-4aeb-89c1-da6c60c856c2
Midgley, P.A.
bc0a0a3f-0546-4e00-b3f5-7736b35b69f2
2004
Laffont, L.M.
38633fd3-1ddb-45c0-a157-f0c4f0b7e563
Raja, R.
74faf442-38a6-4ac1-84f9-b3c039cb392b
Thomas, J.M.
98879775-7bc8-4aeb-89c1-da6c60c856c2
Midgley, P.A.
bc0a0a3f-0546-4e00-b3f5-7736b35b69f2
Laffont, L.M., Raja, R., Thomas, J.M. and Midgley, P.A.
(2004)
Electron tomography of heterogeneous catalysts.
In Electron Microscopy and Analysis 2003.
Institute of Physics.
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
EMAG conferences are biennial events organised by the Electron Microscopy and Analysis Group of the Institute of Physics. The aim of the EMAG conference series is to provide a forum for discussion of the latest developments in instrumentation, techniques and applications of electron and scanning probe microscopies. EMAG 2003, the latest conference in this series, was held at the University of Oxford in September 2003. Electron microscopy is now a mainstay characterisation tool for solid state physicists and chemists as well as materials scientists. This volume is intended as a reference covering current developments in this field mainly in the UK but also further afield.
This record has no associated files available for download.
More information
Published date: 2004
Venue - Dates:
Institute of Physics Electron Microscopy and Analysis Group Conference, Oxford, UK, 2003-09-02 - 2003-09-04
Keywords:
resolution, microscopy
Identifiers
Local EPrints ID: 54185
URI: http://eprints.soton.ac.uk/id/eprint/54185
ISBN: 9780750309677
PURE UUID: d44a727a-5b86-440b-9dfc-052a6a779ff0
Catalogue record
Date deposited: 31 Jul 2008
Last modified: 09 Jan 2022 03:22
Export record
Contributors
Author:
L.M. Laffont
Author:
J.M. Thomas
Author:
P.A. Midgley
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics
