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Variation aware analysis of bridging fault testing

Variation aware analysis of bridging fault testing
Variation aware analysis of bridging fault testing
This paper investigates the impact of process variation on test quality with regard to resistive bridging faults. The input logic threshold voltage and gate drive strength parameters are analyzed regarding their process variation induced influence on test quality. The impact of process variation on test quality is studied in terms of test escapes and measured by a robustness metric. It is shown that some bridges are sensitive to process variation in terms of logic behavior, but such variation does not necessarily compromise test quality if the test has high robustness. Experimental results of Monte-Carlo simulation based on recent process variation statistics are presented for ISCAS85 and -89 benchmark circuits, using a 45nm gate library and realistic bridges. The results show that tests generated without consideration of process variation are inadequate in terms of test quality, particularly for small test sets. On the other hand, larger test sets detect more of the logic faults introduced by process variation and have higher test quality.
resistive bridging faults, process variation, test quality, probability, static voltage testing
Ingelsson, Urban
530bc12c-bd69-43d1-9b73-27bf52b8de8d
Al-Hashimi, Bashir M.
0b29c671-a6d2-459c-af68-c4614dce3b5d
Harrod, Peter
d461ce2f-df8a-47ec-a380-167fd3f0bb60
Ingelsson, Urban
530bc12c-bd69-43d1-9b73-27bf52b8de8d
Al-Hashimi, Bashir M.
0b29c671-a6d2-459c-af68-c4614dce3b5d
Harrod, Peter
d461ce2f-df8a-47ec-a380-167fd3f0bb60

Ingelsson, Urban, Al-Hashimi, Bashir M. and Harrod, Peter (2008) Variation aware analysis of bridging fault testing At 17th Asian Test Symposium, Japan. 24 - 27 Nov 2008. 6 pp.

Record type: Conference or Workshop Item (Paper)

Abstract

This paper investigates the impact of process variation on test quality with regard to resistive bridging faults. The input logic threshold voltage and gate drive strength parameters are analyzed regarding their process variation induced influence on test quality. The impact of process variation on test quality is studied in terms of test escapes and measured by a robustness metric. It is shown that some bridges are sensitive to process variation in terms of logic behavior, but such variation does not necessarily compromise test quality if the test has high robustness. Experimental results of Monte-Carlo simulation based on recent process variation statistics are presented for ISCAS85 and -89 benchmark circuits, using a 45nm gate library and realistic bridges. The results show that tests generated without consideration of process variation are inadequate in terms of test quality, particularly for small test sets. On the other hand, larger test sets detect more of the logic faults introduced by process variation and have higher test quality.

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More information

Published date: 24 November 2008
Venue - Dates: 17th Asian Test Symposium, Japan, 2008-11-24 - 2008-11-27
Keywords: resistive bridging faults, process variation, test quality, probability, static voltage testing

Identifiers

Local EPrints ID: 55292
URI: http://eprints.soton.ac.uk/id/eprint/55292
PURE UUID: 0b4992c7-fffc-4600-88c3-b8cd6efe04e6

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Date deposited: 05 Aug 2008
Last modified: 17 Jul 2017 14:33

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Contributors

Author: Urban Ingelsson
Author: Peter Harrod

University divisions

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