Hyperspectral imaging of plasmons with nanoscale resolution
Hyperspectral imaging of plasmons with nanoscale resolution
We report on the development of a new technique for the visualization of plasmon excitations in metal nanostructures. The technique uses a nanoscale source of plasmon waves, a "plasmon nano-torch," created by the impact of a focused electron beam and images the sample using light across a broad range of wavelengths generated from the scattering of plasmons by the structure into the free space. By scanning the sample with the "plasmon nano-torch" the technique allows imaging with nanoscale spatial resolution and imaging at hundreds of wavelengths simultaneously.
Bashevoy, M.V.
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Jonsson, F.
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Chen, Y.
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Zheludev, N.I.
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June 2007
Bashevoy, M.V.
b9c00e78-fd59-4243-a369-f29dd08061fd
Jonsson, F.
7c3532cd-4995-47d6-bae9-137d829afeb1
Chen, Y.
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Zheludev, N.I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
Bashevoy, M.V., Jonsson, F., Chen, Y. and Zheludev, N.I.
(2007)
Hyperspectral imaging of plasmons with nanoscale resolution.
Surface Plasmon Photonics 3, Dijon, France.
17 - 22 Jun 2007.
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Conference or Workshop Item
(Paper)
Abstract
We report on the development of a new technique for the visualization of plasmon excitations in metal nanostructures. The technique uses a nanoscale source of plasmon waves, a "plasmon nano-torch," created by the impact of a focused electron beam and images the sample using light across a broad range of wavelengths generated from the scattering of plasmons by the structure into the free space. By scanning the sample with the "plasmon nano-torch" the technique allows imaging with nanoscale spatial resolution and imaging at hundreds of wavelengths simultaneously.
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Published date: June 2007
Venue - Dates:
Surface Plasmon Photonics 3, Dijon, France, 2007-06-17 - 2007-06-22
Identifiers
Local EPrints ID: 57767
URI: http://eprints.soton.ac.uk/id/eprint/57767
PURE UUID: 81890cc2-3a18-4263-8dab-504dc4a0c40f
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Date deposited: 11 Aug 2008
Last modified: 16 Mar 2024 02:43
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Contributors
Author:
M.V. Bashevoy
Author:
F. Jonsson
Author:
Y. Chen
Author:
N.I. Zheludev
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