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The combined effect of spatial resolution and measurement uncertainty on the accuracy of empirical atmospheric correction

The combined effect of spatial resolution and measurement uncertainty on the accuracy of empirical atmospheric correction
The combined effect of spatial resolution and measurement uncertainty on the accuracy of empirical atmospheric correction
The combined effect of positional uncertainty of field data and pixel size on the accuracy of the empirical line method is examined and quantified. Positional uncertainty reduces accuracy, although this effect decreases as sample size and pixel size increases. For a pre–defined accuracy requirement, this information is used to specify the sample size required for a given pixel size.
2082-2084
IEEE
Hamm, N.
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Atkinson, P.M.
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Milton, E.J.
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Hamm, N.
dc9dbcc2-30fc-42ea-ba68-0d6991679ca6
Atkinson, P.M.
aaaa51e4-a713-424f-92b0-0568b198f425
Milton, E.J.
c447d4a7-b6ee-4782-a205-f240e3f5488b

Hamm, N., Atkinson, P.M. and Milton, E.J. (2003) The combined effect of spatial resolution and measurement uncertainty on the accuracy of empirical atmospheric correction. In IGARSS '03: Proceedings of the International Geoscience and Remote Sensing Symposium, Toulouse, France, 21-25 Jul 2003. Vol. 3. IEEE. pp. 2082-2084 .

Record type: Conference or Workshop Item (Paper)

Abstract

The combined effect of positional uncertainty of field data and pixel size on the accuracy of the empirical line method is examined and quantified. Positional uncertainty reduces accuracy, although this effect decreases as sample size and pixel size increases. For a pre–defined accuracy requirement, this information is used to specify the sample size required for a given pixel size.

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More information

Published date: July 2003
Venue - Dates: International Geoscience and Remote Sensing Symposium (IGARSS), Toulouse, France, 2003-07-21 - 2003-07-25

Identifiers

Local EPrints ID: 5934
URI: http://eprints.soton.ac.uk/id/eprint/5934
PURE UUID: 0f8fe3ed-e474-4b24-8576-c5c374cc5a9a

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Date deposited: 21 May 2004
Last modified: 15 Mar 2024 04:46

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Contributors

Author: N. Hamm
Author: P.M. Atkinson
Author: E.J. Milton

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