XUV diffraction from a self-assembled 2D array of hexagonal close-packed 200nm diameter PMMA spheres
XUV diffraction from a self-assembled 2D array of hexagonal close-packed 200nm diameter PMMA spheres
Laser-generated XUV and soft x-ray radiation sources using high-harmonic generation, typically producing 108 photons per pulse per harmonic (~5 nm to ~50 nm) in a coherent low-divergence beam, are a promising source for nanometer scale imaging. Here we present XUV diffraction from a single-layer self-assembled hexagonal close-packed (HCP) array of 200 nm diameter PMMA nanospheres. Such a lattice is too small to diffract from using visible light, and hence XUV wavelengths are required. We observe a hexagonal diffraction pattern for three diffraction orders - the result of illuminating a single crystal. The observed interference peaks are a convolution of a Bragg peak with both the distribution of lattice planes (due to crystal defects) and the harmonic spectra. However, as these convolutions are in orthogonal directions, they can be independently resolved hence providing useful information on the quality of the crystal and the generated wavelengths. The far-field diffraction pattern from a single-layer HCP array of spheres is the Fourier Transform (FT) of a hexagonal grid of delta functions multiplied by the FT of the scattering function from a single sphere, which can be calculated using the Mie solution to Maxwell's equations. We compare the measured intensity for each of the eighteen observed interference peaks for the harmonic at 27.6 nm, against the theoretical intensity. The excellent agreement over four orders of magnitude indicates that Mie scattering predicts an appropriate form factor for this analysis and also enables us to extract the complex refractive index of PMMA at this wavelength.
Mills, B.
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Chau, C.F.
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Rogers, E.T.F.
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Grant-Jacob, J.
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Stebbings, S.L.
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Praeger, M.
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Froud, C.A.
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Chapman, R.T.
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Butcher, T.J.
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Hanna, D.C.
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Baumberg, J.J.
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Brocklesby, W.S.
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Frey, J.
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August 2008
Mills, B.
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Chau, C.F.
cebb4b2c-ed4f-4e79-8ab7-56fd05701ecb
Rogers, E.T.F.
b92cc8ab-0d91-4b2e-b5c7-8a2f490a36a2
Grant-Jacob, J.
c5d144d8-3c43-4195-8e80-edd96bfda91b
Stebbings, S.L.
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Praeger, M.
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Froud, C.A.
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Chapman, R.T.
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Butcher, T.J.
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Hanna, D.C.
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Baumberg, J.J.
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Brocklesby, W.S.
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Frey, J.
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Mills, B., Chau, C.F., Rogers, E.T.F., Grant-Jacob, J., Stebbings, S.L., Praeger, M., Froud, C.A., Chapman, R.T., Butcher, T.J., Hanna, D.C., Baumberg, J.J., Brocklesby, W.S. and Frey, J.
(2008)
XUV diffraction from a self-assembled 2D array of hexagonal close-packed 200nm diameter PMMA spheres.
Photon 08, Edinburgh, United Kingdom.
26 - 29 Aug 2008.
Record type:
Conference or Workshop Item
(Paper)
Abstract
Laser-generated XUV and soft x-ray radiation sources using high-harmonic generation, typically producing 108 photons per pulse per harmonic (~5 nm to ~50 nm) in a coherent low-divergence beam, are a promising source for nanometer scale imaging. Here we present XUV diffraction from a single-layer self-assembled hexagonal close-packed (HCP) array of 200 nm diameter PMMA nanospheres. Such a lattice is too small to diffract from using visible light, and hence XUV wavelengths are required. We observe a hexagonal diffraction pattern for three diffraction orders - the result of illuminating a single crystal. The observed interference peaks are a convolution of a Bragg peak with both the distribution of lattice planes (due to crystal defects) and the harmonic spectra. However, as these convolutions are in orthogonal directions, they can be independently resolved hence providing useful information on the quality of the crystal and the generated wavelengths. The far-field diffraction pattern from a single-layer HCP array of spheres is the Fourier Transform (FT) of a hexagonal grid of delta functions multiplied by the FT of the scattering function from a single sphere, which can be calculated using the Mie solution to Maxwell's equations. We compare the measured intensity for each of the eighteen observed interference peaks for the harmonic at 27.6 nm, against the theoretical intensity. The excellent agreement over four orders of magnitude indicates that Mie scattering predicts an appropriate form factor for this analysis and also enables us to extract the complex refractive index of PMMA at this wavelength.
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Published date: August 2008
Venue - Dates:
Photon 08, Edinburgh, United Kingdom, 2008-08-26 - 2008-08-29
Organisations:
Optoelectronics Research Centre, Electronics & Computer Science
Identifiers
Local EPrints ID: 63353
URI: http://eprints.soton.ac.uk/id/eprint/63353
PURE UUID: bf2fae64-e58e-42a6-bef3-b4fea97e34a2
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Date deposited: 21 Oct 2008
Last modified: 06 Mar 2024 02:46
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Contributors
Author:
B. Mills
Author:
C.F. Chau
Author:
E.T.F. Rogers
Author:
J. Grant-Jacob
Author:
S.L. Stebbings
Author:
M. Praeger
Author:
C.A. Froud
Author:
R.T. Chapman
Author:
T.J. Butcher
Author:
D.C. Hanna
Author:
J.J. Baumberg
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