Displacement measurements at a connector
contact interface employing a novel thick film sensor
Displacement measurements at a connector
contact interface employing a novel thick film sensor
One of the key failure mechanisms for wiring and connector
systems used in the automotive industry, is fretting and fretting
corrosion at the contact interface of connectors. For many
years, procedures have been carried out under laboratory controlled
conditions to investigate both thermal and vibration fretting
effects using environmental chambers and fretting tests. Both
optical and visual inspections have also been adopted to observe
the movement at the contact interface. However, these methods can
be considerably inconvenient and costly. Furthermore, their suitability
for field applications is limited. In order to study the fretting
degradation at the actual interface for in-situ measurement effectively,
a novel position sensor is designed to monitor the relative
displacement. Thick film techniques are employed to fabricate
miniaturized and cost effective resistive devices. The sensor is assembled
into a connector sample by taking the place of the male
component. When the interface experiences movement, the relative
displacement of the contact point would cause a corresponding
linear change of resistance measured across the male and female
connection. The sensors are validated by a series of experiments
and subsequently used in a field test to establish the relationships
between the fretting effects with temperature, humidity and differential
pressure, which is associated with temperature variation.
fretting, relative displacement, temperature, thick film sensor, vibration
566-573
Lam, Yu-Zhi
2a996163-eec3-478b-8298-002f33cb719f
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770
Maul, C.
b29b4565-722a-41de-9386-d1af3bcc7f04
Atkinson, J.K.
5e9729b2-0e1f-400d-a889-c74f6390ea58
September 2008
Lam, Yu-Zhi
2a996163-eec3-478b-8298-002f33cb719f
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770
Maul, C.
b29b4565-722a-41de-9386-d1af3bcc7f04
Atkinson, J.K.
5e9729b2-0e1f-400d-a889-c74f6390ea58
Lam, Yu-Zhi, McBride, J.W., Maul, C. and Atkinson, J.K.
(2008)
Displacement measurements at a connector
contact interface employing a novel thick film sensor.
IEEE Transactions on Components and Packaging Technologies, 31 (3), .
(doi:10.1109/TCAPT.2008.2001133).
Abstract
One of the key failure mechanisms for wiring and connector
systems used in the automotive industry, is fretting and fretting
corrosion at the contact interface of connectors. For many
years, procedures have been carried out under laboratory controlled
conditions to investigate both thermal and vibration fretting
effects using environmental chambers and fretting tests. Both
optical and visual inspections have also been adopted to observe
the movement at the contact interface. However, these methods can
be considerably inconvenient and costly. Furthermore, their suitability
for field applications is limited. In order to study the fretting
degradation at the actual interface for in-situ measurement effectively,
a novel position sensor is designed to monitor the relative
displacement. Thick film techniques are employed to fabricate
miniaturized and cost effective resistive devices. The sensor is assembled
into a connector sample by taking the place of the male
component. When the interface experiences movement, the relative
displacement of the contact point would cause a corresponding
linear change of resistance measured across the male and female
connection. The sensors are validated by a series of experiments
and subsequently used in a field test to establish the relationships
between the fretting effects with temperature, humidity and differential
pressure, which is associated with temperature variation.
Text
63829.pdf
- Version of Record
More information
Published date: September 2008
Keywords:
fretting, relative displacement, temperature, thick film sensor, vibration
Organisations:
Electro-Mechanical Engineering
Identifiers
Local EPrints ID: 63829
URI: http://eprints.soton.ac.uk/id/eprint/63829
ISSN: 1521-3331
PURE UUID: 659a5176-4c46-4079-8d38-34e1a30ae4ec
Catalogue record
Date deposited: 06 Nov 2008
Last modified: 16 Mar 2024 02:37
Export record
Altmetrics
Contributors
Author:
Yu-Zhi Lam
Author:
C. Maul
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics