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Micro-computer tomography: an aid in the investigation of structural changes in lead zirconate titanate ceramics after temperature-humidity bias testing

Micro-computer tomography: an aid in the investigation of structural changes in lead zirconate titanate ceramics after temperature-humidity bias testing
Micro-computer tomography: an aid in the investigation of structural changes in lead zirconate titanate ceramics after temperature-humidity bias testing
Lead zirconate titanate ceramic actuators are extensively used in electronic and electro-mechanical devices. Under humid conditions with a d.c. bias leakage currents increase power consumption In some materials the increasing leakage current is accompanied by the evolution of features on the anode surface, but little is known of any changes to the internal structure of the material. This research applies an advanced imaging technique (micro-computer tomography) to non-destructively investigate these features. This allows the evolution of internal features over time to be studied. The findings reveal that the microstructure of the ceramic was significantly altered during environmental testing.
1385-3449
4pp
Lipscomb, I.P.
bb93c4d9-33b7-4323-9e3c-8922d13994cc
Weaver, P.M.
649cbff1-3909-4d09-bab6-79ef325089d0
Swingler, J.
c6e2a49e-fadd-4f38-99f7-0ee1e2c92fac
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770
Lipscomb, I.P.
bb93c4d9-33b7-4323-9e3c-8922d13994cc
Weaver, P.M.
649cbff1-3909-4d09-bab6-79ef325089d0
Swingler, J.
c6e2a49e-fadd-4f38-99f7-0ee1e2c92fac
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770

Lipscomb, I.P., Weaver, P.M., Swingler, J. and McBride, J.W. (2008) Micro-computer tomography: an aid in the investigation of structural changes in lead zirconate titanate ceramics after temperature-humidity bias testing. Journal of Electroceramics, 4pp. (doi:10.1007/s10832-008-9537-8).

Record type: Article

Abstract

Lead zirconate titanate ceramic actuators are extensively used in electronic and electro-mechanical devices. Under humid conditions with a d.c. bias leakage currents increase power consumption In some materials the increasing leakage current is accompanied by the evolution of features on the anode surface, but little is known of any changes to the internal structure of the material. This research applies an advanced imaging technique (micro-computer tomography) to non-destructively investigate these features. This allows the evolution of internal features over time to be studied. The findings reveal that the microstructure of the ceramic was significantly altered during environmental testing.

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More information

Published date: 3 August 2008

Identifiers

Local EPrints ID: 64262
URI: http://eprints.soton.ac.uk/id/eprint/64262
ISSN: 1385-3449
PURE UUID: e2530970-b80a-46c0-9f79-fd6e43a32e02
ORCID for J.W. McBride: ORCID iD orcid.org/0000-0002-3024-0326

Catalogue record

Date deposited: 18 Dec 2008
Last modified: 16 Mar 2024 02:37

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Contributors

Author: I.P. Lipscomb
Author: P.M. Weaver
Author: J. Swingler
Author: J.W. McBride ORCID iD

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