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BaTiO3 and Ba0.77Ca0.27TiO3 doped with rhodium: quantitative determination of photorefractive parameters by EPR-based defects studies

BaTiO3 and Ba0.77Ca0.27TiO3 doped with rhodium: quantitative determination of photorefractive parameters by EPR-based defects studies
BaTiO3 and Ba0.77Ca0.27TiO3 doped with rhodium: quantitative determination of photorefractive parameters by EPR-based defects studies
A detailed knowledge about the defects in an electro-optic material is necessary to understand and steer its photorefractive performance. If applicable, electron paramagnetic resonance (EPR) can furnish the most detailed information about many properties of defects. With the infrared sensitive materials BaTiO3 and Ba0.77Ca0.23TiO3, both doped with rhodium, we shall exemplify how the defect related charge transfer parameters can be determined on this basis. They allow to predict the photorefractive behavior of the materials. All these data are derived from EPR-based defect studies alone.
1094-5695
24
6pp
Optical Society of America
Meyer, M.
25c726d1-8f52-4a77-b913-ae79d4930cd1
Veber, C.
cf8718cf-360b-4105-8666-2bb6d74467df
Schirmer, O.F.
c5a8d08b-d03f-4a4e-8090-9070a952e8ee
Malovichko, G.I.
a8d6a6c1-5fcf-43f7-a6e8-4f35e07b12d2
Grachev, V.G.
bf290147-fee9-49ef-9096-69a61c399919
Kaczmarek, M.
408ec59b-8dba-41c1-89d0-af846d1bf327
Delaye, P.
Denz, C.
Mager, L.
Montemezzani, G.
Meyer, M.
25c726d1-8f52-4a77-b913-ae79d4930cd1
Veber, C.
cf8718cf-360b-4105-8666-2bb6d74467df
Schirmer, O.F.
c5a8d08b-d03f-4a4e-8090-9070a952e8ee
Malovichko, G.I.
a8d6a6c1-5fcf-43f7-a6e8-4f35e07b12d2
Grachev, V.G.
bf290147-fee9-49ef-9096-69a61c399919
Kaczmarek, M.
408ec59b-8dba-41c1-89d0-af846d1bf327
Delaye, P.
Denz, C.
Mager, L.
Montemezzani, G.

Meyer, M., Veber, C., Schirmer, O.F., Malovichko, G.I., Grachev, V.G. and Kaczmarek, M. (2003) BaTiO3 and Ba0.77Ca0.27TiO3 doped with rhodium: quantitative determination of photorefractive parameters by EPR-based defects studies. In, Delaye, P., Denz, C., Mager, L. and Montemezzani, G. (eds.) Photorefractive Effects, Materials, and Devices. (OSA Trends in Optics and Photonics, 24, 87) Photorefractive Effects, Materials, and Devices (PEMD) (17/06/03) USA. Optical Society of America, 6pp.

Record type: Book Section

Abstract

A detailed knowledge about the defects in an electro-optic material is necessary to understand and steer its photorefractive performance. If applicable, electron paramagnetic resonance (EPR) can furnish the most detailed information about many properties of defects. With the infrared sensitive materials BaTiO3 and Ba0.77Ca0.23TiO3, both doped with rhodium, we shall exemplify how the defect related charge transfer parameters can be determined on this basis. They allow to predict the photorefractive behavior of the materials. All these data are derived from EPR-based defect studies alone.

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More information

Published date: 17 June 2003
Venue - Dates: Photorefractive Effects, Materials, and Devices (PEMD), 2003-06-17 - 2003-06-17

Identifiers

Local EPrints ID: 64281
URI: https://eprints.soton.ac.uk/id/eprint/64281
ISSN: 1094-5695
PURE UUID: b32eb96c-9384-4d08-afe2-67b00b9fd66b

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Date deposited: 15 Jan 2009
Last modified: 13 Mar 2019 20:22

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