Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array
Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array
Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 196 ±1.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities of the observed diffraction peaks for the first three orders. By measuring the diffraction intensities in this way, we demonstrate a technique for obtaining the complex refractive index of a material at multiple wavelengths in the XUV from a single measurement. We present experimental results for polystyrene in the range of 25-30 nm.
Mills, B.
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Chau, C.F.
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Rogers, E.T.F.
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Grant-Jacob, J.
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Stebbings, S.L.
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Praeger, M.
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de Paula, A.M.
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Froud, C.A.
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Butcher, T.J.
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Baumberg, J.J.
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Brocklesby, W.S.
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Frey, J.G.
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December 2008
Mills, B.
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Chau, C.F.
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Rogers, E.T.F.
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Grant-Jacob, J.
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Stebbings, S.L.
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Praeger, M.
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de Paula, A.M.
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Froud, C.A.
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Butcher, T.J.
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Baumberg, J.J.
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Brocklesby, W.S.
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Frey, J.G.
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Mills, B., Chau, C.F., Rogers, E.T.F., Grant-Jacob, J., Stebbings, S.L., Praeger, M., de Paula, A.M., Froud, C.A., Butcher, T.J., Baumberg, J.J., Brocklesby, W.S. and Frey, J.G.
(2008)
Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array.
Applied Physics Letters, 93 (23), [231103].
(doi:10.1063/1.3033549).
Abstract
Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 196 ±1.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities of the observed diffraction peaks for the first three orders. By measuring the diffraction intensities in this way, we demonstrate a technique for obtaining the complex refractive index of a material at multiple wavelengths in the XUV from a single measurement. We present experimental results for polystyrene in the range of 25-30 nm.
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e-pub ahead of print date: 9 December 2008
Published date: December 2008
Organisations:
Chemistry, Optoelectronics Research Centre, Electronics & Computer Science
Identifiers
Local EPrints ID: 65815
URI: http://eprints.soton.ac.uk/id/eprint/65815
ISSN: 0003-6951
PURE UUID: 0f601421-8dc9-40ed-b607-a7d28d08a9d7
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Date deposited: 20 Mar 2009
Last modified: 14 Mar 2024 02:56
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Contributors
Author:
B. Mills
Author:
C.F. Chau
Author:
E.T.F. Rogers
Author:
J. Grant-Jacob
Author:
S.L. Stebbings
Author:
M. Praeger
Author:
A.M. de Paula
Author:
C.A. Froud
Author:
T.J. Butcher
Author:
J.J. Baumberg
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