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Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array

Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array
Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array
Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 196 ±1.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities of the observed diffraction peaks for the first three orders. By measuring the diffraction intensities in this way, we demonstrate a technique for obtaining the complex refractive index of a material at multiple wavelengths in the XUV from a single measurement. We present experimental results for polystyrene in the range of 25-30 nm.
0003-6951
231103-[3pp.]
Mills, B.
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Chau, C.F.
cebb4b2c-ed4f-4e79-8ab7-56fd05701ecb
Rogers, E.T.F.
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Grant-Jacob, J.
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Stebbings, S.L.
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Praeger, M.
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de Paula, A.M.
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Froud, C.A.
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Butcher, T.J.
77bed03c-ae8f-4e12-8c35-974150a7cc2d
Baumberg, J.J.
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Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Frey, J.G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
Mills, B.
05f1886e-96ef-420f-b856-4115f4ab36d0
Chau, C.F.
cebb4b2c-ed4f-4e79-8ab7-56fd05701ecb
Rogers, E.T.F.
b92cc8ab-0d91-4b2e-b5c7-8a2f490a36a2
Grant-Jacob, J.
c5d144d8-3c43-4195-8e80-edd96bfda91b
Stebbings, S.L.
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Praeger, M.
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de Paula, A.M.
834793cd-08ba-4c24-9d74-d8d4d8206867
Froud, C.A.
516351fa-45f9-4566-aa2b-71776e7d5ede
Butcher, T.J.
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Baumberg, J.J.
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Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Frey, J.G.
ba60c559-c4af-44f1-87e6-ce69819bf23f

Mills, B., Chau, C.F., Rogers, E.T.F., Grant-Jacob, J., Stebbings, S.L., Praeger, M., de Paula, A.M., Froud, C.A., Butcher, T.J., Baumberg, J.J., Brocklesby, W.S. and Frey, J.G. (2008) Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array. Applied Physics Letters, 93 (23), 231103-[3pp.]. (doi:10.1063/1.3033549).

Record type: Article

Abstract

Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 196 ±1.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities of the observed diffraction peaks for the first three orders. By measuring the diffraction intensities in this way, we demonstrate a technique for obtaining the complex refractive index of a material at multiple wavelengths in the XUV from a single measurement. We present experimental results for polystyrene in the range of 25-30 nm.

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Published date: December 2008
Organisations: Chemistry, Optoelectronics Research Centre, Electronics & Computer Science

Identifiers

Local EPrints ID: 65815
URI: http://eprints.soton.ac.uk/id/eprint/65815
ISSN: 0003-6951
PURE UUID: 0f601421-8dc9-40ed-b607-a7d28d08a9d7
ORCID for B. Mills: ORCID iD orcid.org/0000-0002-1784-1012
ORCID for J. Grant-Jacob: ORCID iD orcid.org/0000-0002-4270-4247
ORCID for W.S. Brocklesby: ORCID iD orcid.org/0000-0002-2123-6712
ORCID for J.G. Frey: ORCID iD orcid.org/0000-0003-0842-4302

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Date deposited: 20 Mar 2009
Last modified: 26 Nov 2019 02:08

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Contributors

Author: B. Mills ORCID iD
Author: C.F. Chau
Author: E.T.F. Rogers
Author: J. Grant-Jacob ORCID iD
Author: S.L. Stebbings
Author: M. Praeger
Author: A.M. de Paula
Author: C.A. Froud
Author: T.J. Butcher
Author: J.J. Baumberg
Author: W.S. Brocklesby ORCID iD
Author: J.G. Frey ORCID iD

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