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Measuring twist of planar patterns (from meta-materials to galaxies)

Measuring twist of planar patterns (from meta-materials to galaxies)
Measuring twist of planar patterns (from meta-materials to galaxies)
Schwanecke, A.S.
ee362335-ee3e-4c26-8035-5c397e10b274
Zheludev, N.I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
Schwanecke, A.S.
ee362335-ee3e-4c26-8035-5c397e10b274
Zheludev, N.I.
32fb6af7-97e4-4d11-bca6-805745e40cc6

Schwanecke, A.S. and Zheludev, N.I. (2005) Measuring twist of planar patterns (from meta-materials to galaxies). Workshop on Metamaterials for Microwave and Optical Technologies, Spain. 18 - 20 Jul 2005.

Record type: Conference or Workshop Item (Paper)

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More information

Published date: 2005
Venue - Dates: Workshop on Metamaterials for Microwave and Optical Technologies, Spain, 2005-07-18 - 2005-07-20

Identifiers

Local EPrints ID: 71006
URI: https://eprints.soton.ac.uk/id/eprint/71006
PURE UUID: e50c480a-a9b0-45f1-a7ca-4b7f38710587
ORCID for N.I. Zheludev: ORCID iD orcid.org/0000-0002-1013-6636

Catalogue record

Date deposited: 11 Dec 2009
Last modified: 06 Jun 2018 13:09

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Contributors

Author: A.S. Schwanecke
Author: N.I. Zheludev ORCID iD

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