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The resolution dependence of measured fractal characteristics for a real un-dismantled electrical contact interface

Swingler, J. (2010) The resolution dependence of measured fractal characteristics for a real un-dismantled electrical contact interface Wear, 268, (9-10), pp. 1178-1183. (doi:10.1016/j.wear.2009.12.034).

Record type: Article


An electrical contact interface is visualized by rendering “contact maps” from X-ray Computer Tomography(CT) images without the need for dismantling the specimens. The contact maps consist of approximately 1500 pixels×1500 pixels with each pixel relating to an 8.0m×8.0m×8.0mvolume
at the interface.

The specimens consist of bolting a cable lug to a printed circuit board. The resolution dependence of measured fractal characteristics is studied for a contact interface with a normal force of 1.6 kN. The total mechanical area of contact, Am, is found to be invariant with resolution whereas the largest contact spot size, AL, is found to decrease with higher resolution.

The number of spots on the apparent area of contact is found to increase with resolution but a spot increasingly has areas of noncontact within itself at higher resolution.

The fractal dimension, D, of the spot area is found to converge to 1 at lower resolution consistent with self-affinity behaviour. At higher resolution D converges to a value <2.

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More information

e-pub ahead of print date: December 2009
Published date: March 2010
Additional Information: doi:10.1016/j.wear.2009.12.034
Keywords: contact, contact maps, spot size, x-ray computer tomography
Organisations: Engineering Sciences


Local EPrints ID: 71743
ISSN: 0043-1648
PURE UUID: 2bc47cb3-65b2-4b38-b1e4-3e62d22923d8

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Date deposited: 04 Jan 2010
Last modified: 18 Jul 2017 23:58

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Author: J. Swingler

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