Closure to “Discussion on ‘The use of hall effect semiconductors in geotechnical instrumentation’ by F. Tatsuoka, S. Shibuya, S. Goto, T. Sato, and X. J. Kong”
Closure to “Discussion on ‘The use of hall effect semiconductors in geotechnical instrumentation’ by F. Tatsuoka, S. Shibuya, S. Goto, T. Sato, and X. J. Kong”
65-68
Clayton, C.R.I.
8397d691-b35b-4d3f-a6d8-40678f233869
Khatrush, S.A.
77c264a4-335a-4a82-b022-4419bf7aa799
Bica, A.V.D
0c884221-c53b-46fd-8300-3e5d006ebde5
Siddique, A.
e0e45f72-cb50-48e9-8fd7-02e2f6ca8cc9
March 1990
Clayton, C.R.I.
8397d691-b35b-4d3f-a6d8-40678f233869
Khatrush, S.A.
77c264a4-335a-4a82-b022-4419bf7aa799
Bica, A.V.D
0c884221-c53b-46fd-8300-3e5d006ebde5
Siddique, A.
e0e45f72-cb50-48e9-8fd7-02e2f6ca8cc9
Clayton, C.R.I., Khatrush, S.A., Bica, A.V.D and Siddique, A.
(1990)
Closure to “Discussion on ‘The use of hall effect semiconductors in geotechnical instrumentation’ by F. Tatsuoka, S. Shibuya, S. Goto, T. Sato, and X. J. Kong”.
Geotechnical Testing Journal, 13 (1), .
(doi:10.1520/GTJ10150J).
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Published date: March 1990
Identifiers
Local EPrints ID: 74738
URI: http://eprints.soton.ac.uk/id/eprint/74738
PURE UUID: 948c4106-7d4f-4688-8637-ee6dd044e562
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Date deposited: 11 Mar 2010
Last modified: 14 Mar 2024 02:43
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Contributors
Author:
S.A. Khatrush
Author:
A.V.D Bica
Author:
A. Siddique
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