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Refractive index dispersion of gallium lanthanum sulfide and oxysulfide glasses

Refractive index dispersion of gallium lanthanum sulfide and oxysulfide glasses
Refractive index dispersion of gallium lanthanum sulfide and oxysulfide glasses
Gallium lanthanum sulfide-based glasses are attractive for new laser and nonlinear optical applications at near Infrared region. Refractive indexes were measured for Ga2As3-La2S3 and Ga2S3-La2O3 glasses in the range of 0.5 and 1.7µm using the minimum deviation method. Data is analysed by Wemple and Didomenico equation. These glasses have relatively large average electronic bandgaps E in comparison with other chalcogenide glasses. Possible origins of these features are discussed.
Takebe, H.
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Yayama, H.
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Morinaga, K.
35e9eb13-61bf-4161-ba9b-ad7634e9341c
Hewak, D.W.
87c80070-c101-4f7a-914f-4cc3131e3db0
Fujino, S.
873d1ba9-26c4-4750-8a94-5f398fd07fa1
Takebe, H.
7dbc1b40-b524-47b8-a478-2808dd167844
Yayama, H.
598b8b63-e663-4438-90a6-de1aa67e93af
Morinaga, K.
35e9eb13-61bf-4161-ba9b-ad7634e9341c
Hewak, D.W.
87c80070-c101-4f7a-914f-4cc3131e3db0
Fujino, S.
873d1ba9-26c4-4750-8a94-5f398fd07fa1

Takebe, H., Yayama, H., Morinaga, K., Hewak, D.W. and Fujino, S. (1997) Refractive index dispersion of gallium lanthanum sulfide and oxysulfide glasses. 12th International Conference on Optical Fiber Sensors, Williamsburg, United States. 28 - 31 Oct 1997.

Record type: Conference or Workshop Item (Paper)

Abstract

Gallium lanthanum sulfide-based glasses are attractive for new laser and nonlinear optical applications at near Infrared region. Refractive indexes were measured for Ga2As3-La2S3 and Ga2S3-La2O3 glasses in the range of 0.5 and 1.7µm using the minimum deviation method. Data is analysed by Wemple and Didomenico equation. These glasses have relatively large average electronic bandgaps E in comparison with other chalcogenide glasses. Possible origins of these features are discussed.

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More information

Published date: 1997
Venue - Dates: 12th International Conference on Optical Fiber Sensors, Williamsburg, United States, 1997-10-28 - 1997-10-31
Learn more about Optoelectronics Research Centre research

Identifiers

Local EPrints ID: 76752
URI: http://eprints.soton.ac.uk/id/eprint/76752
PURE UUID: edf5d294-6a45-4ef7-9f0a-3e5584260e5a
ORCID for D.W. Hewak: ORCID iD orcid.org/0000-0002-2093-5773

Catalogue record

Date deposited: 11 Mar 2010
Last modified: 11 Dec 2021 02:59

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Contributors

Author: H. Takebe
Author: H. Yayama
Author: K. Morinaga
Author: D.W. Hewak ORCID iD
Author: S. Fujino

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