Luminescence measurements and properties of Ti:sapphire layers created by PLD


Jelínek, M., Oswald, J., Jastrabík, L., Lančok, J., Nikl, M., Chvostová, D., Eason, R.W., Anderson, A.A., Fotakis, C., Grivas, C., Flory, F., Kubelka, J. and Čtyroký, J. (1996) Luminescence measurements and properties of Ti:sapphire layers created by PLD At Photonics, China.

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Description/Abstract

The development of miniature, compact and efficient lasers compatible with fiber and integrated optics are of great interest from scientific and technological point of view. Planar waveguide lasers are of interest in the last several years. In this work we describe the properties of Ti:sapphire films created on sapphire and quartz substrates by method of pulsed laser deposition (PLD)......

Item Type: Conference or Workshop Item (Paper)
Venue - Dates: Photonics, China, 1996-11-01
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ePrint ID: 76867
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Date Event
November 1996Published
Date Deposited: 11 Mar 2010
Last Modified: 18 Apr 2017 20:36
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/76867

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