Waveguiding and crystallographic properties of single crystal Ti:sapphire layers produced by pulsed laser deposition


Anderson, A.A., Eason, R.W., Jelínek, M., Hickey, L.M.B., Grivas, C., Fotakis, C., Rogers, K.D. and Lane, D. (1996) Waveguiding and crystallographic properties of single crystal Ti:sapphire layers produced by pulsed laser deposition At Conference on Lasers and Electro-Optics Europe, Germany.

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Description/Abstract

Layers of Ti:Sapphire were deposited over a range 1300K-1700K, with thicknesses between 1-82 microns on sapphire substrates. These were crystalline over the entire range. Waveguiding was observed without any additional co-dopants.

Item Type: Conference or Workshop Item (Paper)
Venue - Dates: Conference on Lasers and Electro-Optics Europe, Germany, 1996-09-01
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ePrint ID: 76936
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Date Event
September 1996Published
Date Deposited: 11 Mar 2010
Last Modified: 18 Apr 2017 20:35
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/76936

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