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Transient polarization-sensitive reflective spectroscopy of semiconductors and metals

Transient polarization-sensitive reflective spectroscopy of semiconductors and metals
Transient polarization-sensitive reflective spectroscopy of semiconductors and metals
Zheludev, N.I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
Zheludev, N.I.
32fb6af7-97e4-4d11-bca6-805745e40cc6

Zheludev, N.I. (1998) Transient polarization-sensitive reflective spectroscopy of semiconductors and metals. 15th International Conference on Coherent and Nonlinear Optics, Russian Federation. 29 Jun - 03 Jul 1998.

Record type: Conference or Workshop Item (Paper)

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More information

Published date: 1998
Additional Information: Technical Digest Paper CtuX2
Venue - Dates: 15th International Conference on Coherent and Nonlinear Optics, Russian Federation, 1998-06-29 - 1998-07-03

Identifiers

Local EPrints ID: 77053
URI: https://eprints.soton.ac.uk/id/eprint/77053
PURE UUID: 1ce4266c-4e9f-4e6f-8368-eb86dc3af8ec
ORCID for N.I. Zheludev: ORCID iD orcid.org/0000-0002-1013-6636

Catalogue record

Date deposited: 11 Mar 2010
Last modified: 06 Jun 2018 13:09

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