Transient polarization sensitive reflective spectroscopy of semiconductors and metals

Zheludev, N.I. (1995) Transient polarization sensitive reflective spectroscopy of semiconductors and metals. Ultrafast Processes in Spectroscopy, Trieste, Italy. 30 Oct - 03 Nov 1995.

Record type: Conference or Workshop Item (Paper)

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Published date: 1995

Venue - Dates: Ultrafast Processes in Spectroscopy, Trieste, Italy, 1995-10-30 - 1995-11-03

Learn more about Optoelectronics Research Centre research

Identifiers

Local EPrints ID: 77055

URI: http://eprints.soton.ac.uk/id/eprint/77055

PURE UUID: bf6bd6d8-f596-481e-9305-ed1f1b683592

ORCID for N.I. Zheludev:

orcid.org/0000-0002-1013-6636

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Date deposited: 11 Mar 2010

Last modified: 30 Jan 2020 01:26

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Contributors

Author: N.I. Zheludev

University divisions

Faculties (pre 2011 reorg) > Faculty of Engineering Science & Maths (pre 2011 reorg) > Optoelectronics Research Centre (pre 2011 reorg)
Current Faculties > Faculty of Engineering and Physical Sciences > Zepler Institute for Photonics and Nanoelectronics > Optoelectronics Research Centre (pre 2011 reorg)
Zepler Institute for Photonics and Nanoelectronics > Optoelectronics Research Centre (pre 2011 reorg)

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