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Strong photo-induced refractive index changes in RF-sputtered tantalum oxide planar waveguides

Strong photo-induced refractive index changes in RF-sputtered tantalum oxide planar waveguides
Strong photo-induced refractive index changes in RF-sputtered tantalum oxide planar waveguides
Large negative UV-induced index changes (~ -0.01) have been measured in sputtered tantalum oxide planar waveguides using an optical fibre probe capable of accurately monitoring both the magnitude and the sign of the index change.
Roe, M.P.
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Hempstead, M.
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Archambault, J.L.
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Russell, P.St.J.
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Dong, L.
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Roe, M.P.
c0b88f51-a78a-4415-b9fb-76fff227acdd
Hempstead, M.
1bc4f2eb-fba7-46b8-b0c6-199f586b9954
Archambault, J.L.
22245ae0-fbe9-4d25-a850-f3b38c78848a
Russell, P.St.J.
77db5e8d-8223-4806-ae60-a106619a022a
Dong, L.
4a30a247-d676-42ef-aaf4-061579d6d64e

Roe, M.P., Hempstead, M., Archambault, J.L., Russell, P.St.J. and Dong, L. (1994) Strong photo-induced refractive index changes in RF-sputtered tantalum oxide planar waveguides. CLEO Europe: Conference on Lasers & Electro-Optics Europe, Amsterdam, Amsterdam, Netherlands. 28 Aug - 02 Sep 1994.

Record type: Conference or Workshop Item (Paper)

Abstract

Large negative UV-induced index changes (~ -0.01) have been measured in sputtered tantalum oxide planar waveguides using an optical fibre probe capable of accurately monitoring both the magnitude and the sign of the index change.

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Published date: 1994
Venue - Dates: CLEO Europe: Conference on Lasers & Electro-Optics Europe, Amsterdam, Amsterdam, Netherlands, 1994-08-28 - 1994-09-02

Identifiers

Local EPrints ID: 77143
URI: http://eprints.soton.ac.uk/id/eprint/77143
PURE UUID: 96d9cefd-60e1-4930-a5e3-07fb41e1b685

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Date deposited: 11 Mar 2010
Last modified: 13 Mar 2024 23:44

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Contributors

Author: M.P. Roe
Author: M. Hempstead
Author: J.L. Archambault
Author: P.St.J. Russell
Author: L. Dong

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