Distributed grating sensors using low-coherence reflectometry

Volanthen, M., Geiger, H. and Dakin, J.P. (1997) Distributed grating sensors using low-coherence reflectometry Journal of Lightwave Technology, 15, (11), pp. 2076-2082. (doi:10.1109/50.641525).


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Distributed grating sensors have recently been interrogated with low-coherence reflectometry. Initial results have been enhanced using two new and versatile configurations. The first system tracks the wavelength using a closed-loop scheme, while the second system scans the distance using an open-loop approach. Arbitrary strain and temperature profiles along gratings have been examined with 300 µm spatial resolution and 5.4 µ.epsilon/√Hz accuracy. A theoretical model of the interrogation technique is derived and the predicted performance limits are examined experimentally.

Item Type: Article
Digital Object Identifier (DOI): doi:10.1109/50.641525
ISSNs: 0733-8724 (print)
Related URLs:
Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Organisations: Optoelectronics Research Centre
ePrint ID: 77970
Date :
Date Event
Date Deposited: 11 Mar 2010
Last Modified: 16 Jun 2017 16:42
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/77970

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