High resolution x-ray characterization of periodically domain-inverted nonlinear optical crystals


Hu, Z.W., Thomas, P.A. and Webjörn, J. (1995) High resolution x-ray characterization of periodically domain-inverted nonlinear optical crystals Journal of Physics D: Applied Physics, 28, (4A), A189-A194. (doi:10.1088/0022-3727/28/4A/037).

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Description/Abstract

A high-resolution triple-axis diffractometer has been used for the structural characterization of periodically domain-inverted nonlinear optical crystals of KTiOPO4 and LNbO3. Striations have been revealed in high strain-sensitivity multiple-crystal topographs of the domain-inverted regions of both these samples and these are dominated by orientation contrast. The combination of high-resolution reciprocal-space mapping and topography has shown that the extended diffraction streak in the q[210] direction for domain-inverted LiNbO3 originates from the "minutely misoriented structure" which is related to the original configuration of dislocations. The reason for the generation of the structural imperfections via the domain-inversion processing is interpreted in terms of the converse piezoelectric effect.

Item Type: Article
Digital Object Identifier (DOI): doi:10.1088/0022-3727/28/4A/037
ISSNs: 0022-3727 (print)
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ePrint ID: 78171
Date :
Date Event
1995Published
Date Deposited: 11 Mar 2010
Last Modified: 18 Apr 2017 20:24
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/78171

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