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Femtosecond cubic optical nonlinearity of thin nickel films

Femtosecond cubic optical nonlinearity of thin nickel films
Femtosecond cubic optical nonlinearity of thin nickel films
Transient pump–probe measurements of circular anisotropy in nickel films induced by 38-fs optical pulses show an instantaneous response that is related to the optical orientation of the spins of free electrons. Measurements in a sample of variable thickness, performed in both transmission and reflection, revealed that the surface significantly influences the degenerate cubic optical nonlinearity of the nickel films to a depth of approximately 4–5 nm into the bulk.
0146-9592
1373-1375
Bennett, P.J.
e7be07a4-bbed-499c-b759-29391778474e
Albanis, V.
c5691c2e-71bc-4ca2-8d65-c0396fa228c2
Svirko, Y.P.
ff9d5c74-0e2c-48eb-84ba-3800c29d9a67
Zheludev, N.I.
32fb6af7-97e4-4d11-bca6-805745e40cc6
Bennett, P.J.
e7be07a4-bbed-499c-b759-29391778474e
Albanis, V.
c5691c2e-71bc-4ca2-8d65-c0396fa228c2
Svirko, Y.P.
ff9d5c74-0e2c-48eb-84ba-3800c29d9a67
Zheludev, N.I.
32fb6af7-97e4-4d11-bca6-805745e40cc6

Bennett, P.J., Albanis, V., Svirko, Y.P. and Zheludev, N.I. (1999) Femtosecond cubic optical nonlinearity of thin nickel films. Optics Letters, 24 (19), 1373-1375. (doi:10.1364/OL.24.001373).

Record type: Article

Abstract

Transient pump–probe measurements of circular anisotropy in nickel films induced by 38-fs optical pulses show an instantaneous response that is related to the optical orientation of the spins of free electrons. Measurements in a sample of variable thickness, performed in both transmission and reflection, revealed that the surface significantly influences the degenerate cubic optical nonlinearity of the nickel films to a depth of approximately 4–5 nm into the bulk.

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Published date: October 1999

Identifiers

Local EPrints ID: 78332
URI: https://eprints.soton.ac.uk/id/eprint/78332
ISSN: 0146-9592
PURE UUID: 1f127b26-5209-41b4-9649-5d116df10c1e
ORCID for N.I. Zheludev: ORCID iD orcid.org/0000-0002-1013-6636

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Date deposited: 11 Mar 2010
Last modified: 13 Dec 2019 01:39

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