Epitaxial growth of Bi12GeO20 thin film optical waveguides using excimer laser ablation
Epitaxial growth of Bi12GeO20 thin film optical waveguides using excimer laser ablation
Thin-film optical waveguides of the photorefractive optical material bismuth germanium oxide (Bi12GeO20) have been epitaxially grown onto heated zirconia substrates by excimer laser ablative sputtering. The epitaxial nature and stoichiometry of the films were verified using x-ray diffraction analysis. Waveguide modes were observed for effective refractive indices in close agreement with theoretical predictions.
1929-1931
Youden, K.E.
a6d0080b-f644-4c67-862e-cb0aeb72b508
Eason, R.W.
e38684c3-d18c-41b9-a4aa-def67283b020
Gower, M.C.
daaa0c09-31f0-4d0b-9d75-55ebf97e3a2a
Vainos, N.A.
e4f22637-2f1c-4dec-af67-d059261dd5b2
14 October 1991
Youden, K.E.
a6d0080b-f644-4c67-862e-cb0aeb72b508
Eason, R.W.
e38684c3-d18c-41b9-a4aa-def67283b020
Gower, M.C.
daaa0c09-31f0-4d0b-9d75-55ebf97e3a2a
Vainos, N.A.
e4f22637-2f1c-4dec-af67-d059261dd5b2
Youden, K.E., Eason, R.W., Gower, M.C. and Vainos, N.A.
(1991)
Epitaxial growth of Bi12GeO20 thin film optical waveguides using excimer laser ablation.
Applied Physics Letters, 59 (16), .
(doi:10.1063/1.106162).
Abstract
Thin-film optical waveguides of the photorefractive optical material bismuth germanium oxide (Bi12GeO20) have been epitaxially grown onto heated zirconia substrates by excimer laser ablative sputtering. The epitaxial nature and stoichiometry of the films were verified using x-ray diffraction analysis. Waveguide modes were observed for effective refractive indices in close agreement with theoretical predictions.
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Published date: 14 October 1991
Identifiers
Local EPrints ID: 78578
URI: http://eprints.soton.ac.uk/id/eprint/78578
ISSN: 0003-6951
PURE UUID: 3e09e403-6861-4027-b0fd-0285917464ed
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Date deposited: 11 Mar 2010
Last modified: 14 Mar 2024 02:33
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Contributors
Author:
K.E. Youden
Author:
R.W. Eason
Author:
M.C. Gower
Author:
N.A. Vainos
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