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Epitaxial growth of Bi12GeO20 thin film optical waveguides using excimer laser ablation

Youden, K.E., Eason, R.W., Gower, M.C. and Vainos, N.A. (1991) Epitaxial growth of Bi12GeO20 thin film optical waveguides using excimer laser ablation Applied Physics Letters, 59, pp. 1929-1931. (doi:10.1063/1.106162).

Record type: Article


Thin-film optical waveguides of the photorefractive optical material bismuth germanium oxide (Bi12GeO20) have been epitaxially grown onto heated zirconia substrates by excimer laser ablative sputtering. The epitaxial nature and stoichiometry of the films were verified using x-ray diffraction analysis. Waveguide modes were observed for effective refractive indices in close agreement with theoretical predictions.

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Published date: 1991


Local EPrints ID: 78578
ISSN: 0003-6951
PURE UUID: 3e09e403-6861-4027-b0fd-0285917464ed
ORCID for R.W. Eason: ORCID iD

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Date deposited: 11 Mar 2010
Last modified: 18 Jul 2017 23:23

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Author: K.E. Youden
Author: R.W. Eason ORCID iD
Author: M.C. Gower
Author: N.A. Vainos

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