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Depth resolution of Piezoresponse force microscopy

Depth resolution of Piezoresponse force microscopy
Depth resolution of Piezoresponse force microscopy
Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection.
0003-6951
172904
Johann, Florian
00d5f95a-b887-4a3b-b675-a09c72abe25c
Ying, Yongjun
a675d129-a77e-4b5d-8e8b-d2b7db0f0ea5
Jungk, Tobias
a66f38ac-5b39-4454-b378-2fc4640e819a
Hoffmann, Ákos
1217a52e-96c5-4b65-b5c3-e34675f98089
Sones, Collin L.
9de9d8ee-d394-46a5-80b7-e341c0eed0a8
Eason, Robert W.
e38684c3-d18c-41b9-a4aa-def67283b020
Mailis, Sakellaris
233e0768-3f8d-430e-8fdf-92e6f4f6a0c4
Soergel, Elisabeth
f2f3cfe9-687e-48e9-9166-606087aba7f4
Johann, Florian
00d5f95a-b887-4a3b-b675-a09c72abe25c
Ying, Yongjun
a675d129-a77e-4b5d-8e8b-d2b7db0f0ea5
Jungk, Tobias
a66f38ac-5b39-4454-b378-2fc4640e819a
Hoffmann, Ákos
1217a52e-96c5-4b65-b5c3-e34675f98089
Sones, Collin L.
9de9d8ee-d394-46a5-80b7-e341c0eed0a8
Eason, Robert W.
e38684c3-d18c-41b9-a4aa-def67283b020
Mailis, Sakellaris
233e0768-3f8d-430e-8fdf-92e6f4f6a0c4
Soergel, Elisabeth
f2f3cfe9-687e-48e9-9166-606087aba7f4

Johann, Florian, Ying, Yongjun, Jungk, Tobias, Hoffmann, Ákos, Sones, Collin L., Eason, Robert W., Mailis, Sakellaris and Soergel, Elisabeth (2009) Depth resolution of Piezoresponse force microscopy. Applied Physics Letters, 94 (172904), 172904.

Record type: Article

Abstract

Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection.

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Published date: 27 April 2009
Organisations: Optoelectronics Research Centre

Identifiers

Local EPrints ID: 78872
URI: https://eprints.soton.ac.uk/id/eprint/78872
ISSN: 0003-6951
PURE UUID: 7a4a04af-540b-4a55-a57c-fbb0c37a5300
ORCID for Robert W. Eason: ORCID iD orcid.org/0000-0001-9704-2204
ORCID for Sakellaris Mailis: ORCID iD orcid.org/0000-0001-8100-2670

Catalogue record

Date deposited: 15 Mar 2010
Last modified: 06 Jun 2018 13:13

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