The University of Southampton
University of Southampton Institutional Repository

Optical properties of CVD grown amorphous Ge-Sb-S thin films

Optical properties of CVD grown amorphous Ge-Sb-S thin films
Optical properties of CVD grown amorphous Ge-Sb-S thin films
Germanium antimony sulphide (Ge-Sb-S) amorphous thin films have been fabricated on commercial glass substrates by chemical vapour deposition (CVD). The compositions and thicknesses of these thin films have been characterized by micro-Raman, scanning electron microscope (SEM) and energy dispersive X-ray analysis (EDX) techniques. Optical transmission spectra measured by UV-VIS-NIR spectrometer have been used to determine the optical properties of these CVD-grown Ge-Sb-S amorphous thin films with Swanepoel's methods. Optical band gaps of these films were calculated from Tauc's extrapolation procedure. The dispersions of the refractive indices of these films have also been determined using the Wemple-DiDomenico method.
chemical vapor deposition, chalcogenides, optical properties
0022-3093
281-285
Huang, C.C.
825f7447-6d02-48f6-b95a-fa33da71f106
Wu, C.C.
00a09c4d-a107-4781-846f-f72856adc5d9
Knight, K.
8834be4f-7dce-43fe-bafd-959e5893bd51
Hewak, D.W.
87c80070-c101-4f7a-914f-4cc3131e3db0
Huang, C.C.
825f7447-6d02-48f6-b95a-fa33da71f106
Wu, C.C.
00a09c4d-a107-4781-846f-f72856adc5d9
Knight, K.
8834be4f-7dce-43fe-bafd-959e5893bd51
Hewak, D.W.
87c80070-c101-4f7a-914f-4cc3131e3db0

Huang, C.C., Wu, C.C., Knight, K. and Hewak, D.W. (2010) Optical properties of CVD grown amorphous Ge-Sb-S thin films. Journal of Non-Crystalline Solids, 356 (4-5), 281-285. (doi:10.1016/j.jnoncrysol.2009.12.027).

Record type: Article

Abstract

Germanium antimony sulphide (Ge-Sb-S) amorphous thin films have been fabricated on commercial glass substrates by chemical vapour deposition (CVD). The compositions and thicknesses of these thin films have been characterized by micro-Raman, scanning electron microscope (SEM) and energy dispersive X-ray analysis (EDX) techniques. Optical transmission spectra measured by UV-VIS-NIR spectrometer have been used to determine the optical properties of these CVD-grown Ge-Sb-S amorphous thin films with Swanepoel's methods. Optical band gaps of these films were calculated from Tauc's extrapolation procedure. The dispersions of the refractive indices of these films have also been determined using the Wemple-DiDomenico method.

This record has no associated files available for download.

More information

Published date: 15 February 2010
Keywords: chemical vapor deposition, chalcogenides, optical properties

Identifiers

Local EPrints ID: 78924
URI: http://eprints.soton.ac.uk/id/eprint/78924
ISSN: 0022-3093
PURE UUID: a4a21e17-a70c-44b8-bcf0-0516f9d89e70
ORCID for C.C. Huang: ORCID iD orcid.org/0000-0003-3471-2463
ORCID for D.W. Hewak: ORCID iD orcid.org/0000-0002-2093-5773

Catalogue record

Date deposited: 16 Mar 2010
Last modified: 14 Mar 2024 02:50

Export record

Altmetrics

Contributors

Author: C.C. Huang ORCID iD
Author: C.C. Wu
Author: K. Knight
Author: D.W. Hewak ORCID iD

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×