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Optical properties of CVD grown amorphous Ge-Sb-S thin films

Record type: Article

Germanium antimony sulphide (Ge-Sb-S) amorphous thin films have been fabricated on commercial glass substrates by chemical vapour deposition (CVD). The compositions and thicknesses of these thin films have been characterized by micro-Raman, scanning electron microscope (SEM) and energy dispersive X-ray analysis (EDX) techniques. Optical transmission spectra measured by UV-VIS-NIR spectrometer have been used to determine the optical properties of these CVD-grown Ge-Sb-S amorphous thin films with Swanepoel's methods. Optical band gaps of these films were calculated from Tauc's extrapolation procedure. The dispersions of the refractive indices of these films have also been determined using the Wemple-DiDomenico method.

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Citation

Huang, C.C., Wu, C.C., Knight, K. and Hewak, D.W. (2010) Optical properties of CVD grown amorphous Ge-Sb-S thin films Journal of Non-Crystalline Solids, 356, (4-5), pp. 281-285. (doi:10.1016/j.jnoncrysol.2009.12.027).

More information

Published date: 15 February 2010
Keywords: chemical vapor deposition, chalcogenides, optical properties

Identifiers

Local EPrints ID: 78924
URI: http://eprints.soton.ac.uk/id/eprint/78924
ISSN: 0022-3093
PURE UUID: a4a21e17-a70c-44b8-bcf0-0516f9d89e70
ORCID for C.C. Huang: ORCID iD orcid.org/0000-0003-3471-2463
ORCID for D.W. Hewak: ORCID iD orcid.org/0000-0002-2093-5773

Catalogue record

Date deposited: 16 Mar 2010
Last modified: 18 Jul 2017 23:20

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Contributors

Author: C.C. Huang ORCID iD
Author: C.C. Wu
Author: K. Knight
Author: D.W. Hewak ORCID iD

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