Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation
Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation
 
  XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.
  
    
      Mills, B.
      
        05f1886e-96ef-420f-b856-4115f4ab36d0
      
     
  
    
      Chau, C.F.
      
        cebb4b2c-ed4f-4e79-8ab7-56fd05701ecb
      
     
  
    
      Rogers, E.T.F.
      
        b92cc8ab-0d91-4b2e-b5c7-8a2f490a36a2
      
     
  
    
      Grant-Jacob, J.
      
        c5d144d8-3c43-4195-8e80-edd96bfda91b
      
     
  
    
      Stebbings, S.L.
      
        aa7b4db4-3297-485f-8caf-1c1c5951eae5
      
     
  
    
      Praeger, M.
      
        84575f28-4530-4f89-9355-9c5b6acc6cac
      
     
  
    
      de Paula, A.M.
      
        834793cd-08ba-4c24-9d74-d8d4d8206867
      
     
  
    
      Froud, C.A.
      
        516351fa-45f9-4566-aa2b-71776e7d5ede
      
     
  
    
      Chapman, R.T.
      
        e6cd4194-ec2e-43af-8b66-9b03f2ba13f7
      
     
  
    
      Butcher, T.J.
      
        bd3117c7-d50c-48d4-8038-76217b1c0570
      
     
  
    
      Brocklesby, W.S.
      
        c53ca2f6-db65-4e19-ad00-eebeb2e6de67
      
     
  
    
      Frey, J.G.
      
        ba60c559-c4af-44f1-87e6-ce69819bf23f
      
     
  
  
   
  
  
    
      31 May 2009
    
    
  
  
    
      Mills, B.
      
        05f1886e-96ef-420f-b856-4115f4ab36d0
      
     
  
    
      Chau, C.F.
      
        cebb4b2c-ed4f-4e79-8ab7-56fd05701ecb
      
     
  
    
      Rogers, E.T.F.
      
        b92cc8ab-0d91-4b2e-b5c7-8a2f490a36a2
      
     
  
    
      Grant-Jacob, J.
      
        c5d144d8-3c43-4195-8e80-edd96bfda91b
      
     
  
    
      Stebbings, S.L.
      
        aa7b4db4-3297-485f-8caf-1c1c5951eae5
      
     
  
    
      Praeger, M.
      
        84575f28-4530-4f89-9355-9c5b6acc6cac
      
     
  
    
      de Paula, A.M.
      
        834793cd-08ba-4c24-9d74-d8d4d8206867
      
     
  
    
      Froud, C.A.
      
        516351fa-45f9-4566-aa2b-71776e7d5ede
      
     
  
    
      Chapman, R.T.
      
        e6cd4194-ec2e-43af-8b66-9b03f2ba13f7
      
     
  
    
      Butcher, T.J.
      
        bd3117c7-d50c-48d4-8038-76217b1c0570
      
     
  
    
      Brocklesby, W.S.
      
        c53ca2f6-db65-4e19-ad00-eebeb2e6de67
      
     
  
    
      Frey, J.G.
      
        ba60c559-c4af-44f1-87e6-ce69819bf23f
      
     
  
       
    
 
  
    
      
  
  
  
  
    Mills, B., Chau, C.F., Rogers, E.T.F., Grant-Jacob, J., Stebbings, S.L., Praeger, M., de Paula, A.M., Froud, C.A., Chapman, R.T., Butcher, T.J., Brocklesby, W.S. and Frey, J.G.
  
  
  
  
   
    (2009)
  
  
    
    Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation.
  
  
  
  
    
    
    
      
        
   
  
    Conference on Lasers and Electro-Optics (CLEO/IQEC 2009), Baltimore, USA.
   
        
        
        
      
    
  
  
  
  
  
  
  
  
   
  
    
      Record type:
      Conference or Workshop Item
      (Paper)
      
      
    
   
    
    
      
        
          Abstract
          XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.
         
      
      
    
   
  
  
  More information
  
    
      Published date: 31 May 2009
 
    
  
  
    
  
    
  
    
     
        Venue - Dates:
        Conference on Lasers and Electro-Optics (CLEO/IQEC 2009), Baltimore, USA, 2009-05-31
      
    
  
    
  
    
     
    
  
    
  
    
     
        Organisations:
        Optoelectronics Research Centre
      
    
  
    
  
  
        Identifiers
        Local EPrints ID: 78953
        URI: http://eprints.soton.ac.uk/id/eprint/78953
        
        
        
        
          PURE UUID: 9176382a-3e71-4211-8c9a-b7a9502f82f3
        
  
    
        
          
            
              
            
          
        
    
        
          
        
    
        
          
            
          
        
    
        
          
            
              
            
          
        
    
        
          
        
    
        
          
            
              
            
          
        
    
        
          
        
    
        
          
        
    
        
          
        
    
        
          
        
    
        
          
            
              
            
          
        
    
        
          
            
              
            
          
        
    
  
  Catalogue record
  Date deposited: 19 Mar 2010
  Last modified: 14 Mar 2024 02:56
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      Contributors
      
          
          Author:
          
            
              
              
                B. Mills
              
              
                 
              
            
            
          
         
      
          
          Author:
          
            
            
              C.F. Chau
            
          
        
      
          
          Author:
          
            
              
              
                E.T.F. Rogers
              
              
            
            
          
        
      
          
          Author:
          
            
              
              
                J. Grant-Jacob
              
              
                 
              
            
            
          
         
      
          
          Author:
          
            
            
              S.L. Stebbings
            
          
        
      
          
          Author:
          
            
              
              
                M. Praeger
              
              
                 
              
            
            
          
         
      
          
          Author:
          
            
            
              A.M. de Paula
            
          
        
      
          
          Author:
          
            
            
              C.A. Froud
            
          
        
      
          
          Author:
          
            
            
              R.T. Chapman
            
          
        
      
          
          Author:
          
            
            
              T.J. Butcher
            
          
        
      
        
      
        
      
      
      
    
  
   
  
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