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Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation

Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation
Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation
XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.
Mills, B.
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Chau, C.F.
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Rogers, E.T.F.
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Grant-Jacob, J.
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Stebbings, S.L.
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Praeger, M.
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de Paula, A.M.
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Froud, C.A.
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Chapman, R.T.
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Butcher, T.J.
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Brocklesby, W.S.
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Frey, J.G.
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Mills, B.
05f1886e-96ef-420f-b856-4115f4ab36d0
Chau, C.F.
cebb4b2c-ed4f-4e79-8ab7-56fd05701ecb
Rogers, E.T.F.
b92cc8ab-0d91-4b2e-b5c7-8a2f490a36a2
Grant-Jacob, J.
c5d144d8-3c43-4195-8e80-edd96bfda91b
Stebbings, S.L.
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Praeger, M.
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de Paula, A.M.
834793cd-08ba-4c24-9d74-d8d4d8206867
Froud, C.A.
516351fa-45f9-4566-aa2b-71776e7d5ede
Chapman, R.T.
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Butcher, T.J.
bd3117c7-d50c-48d4-8038-76217b1c0570
Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Frey, J.G.
ba60c559-c4af-44f1-87e6-ce69819bf23f

Mills, B., Chau, C.F., Rogers, E.T.F., Grant-Jacob, J., Stebbings, S.L., Praeger, M., de Paula, A.M., Froud, C.A., Chapman, R.T., Butcher, T.J., Brocklesby, W.S. and Frey, J.G. (2009) Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation. Conference on Lasers and Electro-Optics (CLEO/IQEC 2009), Baltimore, USA.

Record type: Conference or Workshop Item (Paper)

Abstract

XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.

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Published date: 31 May 2009
Venue - Dates: Conference on Lasers and Electro-Optics (CLEO/IQEC 2009), Baltimore, USA, 2009-05-31
Organisations: Optoelectronics Research Centre

Identifiers

Local EPrints ID: 78953
URI: http://eprints.soton.ac.uk/id/eprint/78953
PURE UUID: 9176382a-3e71-4211-8c9a-b7a9502f82f3
ORCID for B. Mills: ORCID iD orcid.org/0000-0002-1784-1012
ORCID for J. Grant-Jacob: ORCID iD orcid.org/0000-0002-4270-4247
ORCID for M. Praeger: ORCID iD orcid.org/0000-0002-5814-6155
ORCID for W.S. Brocklesby: ORCID iD orcid.org/0000-0002-2123-6712
ORCID for J.G. Frey: ORCID iD orcid.org/0000-0003-0842-4302

Catalogue record

Date deposited: 19 Mar 2010
Last modified: 14 Mar 2024 02:56

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Contributors

Author: B. Mills ORCID iD
Author: C.F. Chau
Author: E.T.F. Rogers
Author: J. Grant-Jacob ORCID iD
Author: S.L. Stebbings
Author: M. Praeger ORCID iD
Author: A.M. de Paula
Author: C.A. Froud
Author: R.T. Chapman
Author: T.J. Butcher
Author: W.S. Brocklesby ORCID iD
Author: J.G. Frey ORCID iD

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