Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation
Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation
XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.
Mills, B.
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Chau, C.F.
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Rogers, E.T.F.
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Grant-Jacob, J.
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Stebbings, S.L.
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Praeger, M.
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de Paula, A.M.
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Froud, C.A.
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Chapman, R.T.
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Butcher, T.J.
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Brocklesby, W.S.
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Frey, J.G.
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31 May 2009
Mills, B.
05f1886e-96ef-420f-b856-4115f4ab36d0
Chau, C.F.
cebb4b2c-ed4f-4e79-8ab7-56fd05701ecb
Rogers, E.T.F.
b92cc8ab-0d91-4b2e-b5c7-8a2f490a36a2
Grant-Jacob, J.
c5d144d8-3c43-4195-8e80-edd96bfda91b
Stebbings, S.L.
aa7b4db4-3297-485f-8caf-1c1c5951eae5
Praeger, M.
84575f28-4530-4f89-9355-9c5b6acc6cac
de Paula, A.M.
834793cd-08ba-4c24-9d74-d8d4d8206867
Froud, C.A.
516351fa-45f9-4566-aa2b-71776e7d5ede
Chapman, R.T.
e6cd4194-ec2e-43af-8b66-9b03f2ba13f7
Butcher, T.J.
bd3117c7-d50c-48d4-8038-76217b1c0570
Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Frey, J.G.
ba60c559-c4af-44f1-87e6-ce69819bf23f
Mills, B., Chau, C.F., Rogers, E.T.F., Grant-Jacob, J., Stebbings, S.L., Praeger, M., de Paula, A.M., Froud, C.A., Chapman, R.T., Butcher, T.J., Brocklesby, W.S. and Frey, J.G.
(2009)
Simultaneous measurement of structure and XUF dielectric constant of nanoscale objects using diffraction of high harmonic radiation.
Conference on Lasers and Electro-Optics (CLEO/IQEC 2009), Baltimore, USA.
Record type:
Conference or Workshop Item
(Paper)
Abstract
XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres.
More information
Published date: 31 May 2009
Venue - Dates:
Conference on Lasers and Electro-Optics (CLEO/IQEC 2009), Baltimore, USA, 2009-05-31
Organisations:
Optoelectronics Research Centre
Identifiers
Local EPrints ID: 78953
URI: http://eprints.soton.ac.uk/id/eprint/78953
PURE UUID: 9176382a-3e71-4211-8c9a-b7a9502f82f3
Catalogue record
Date deposited: 19 Mar 2010
Last modified: 14 Mar 2024 02:56
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Contributors
Author:
B. Mills
Author:
C.F. Chau
Author:
E.T.F. Rogers
Author:
J. Grant-Jacob
Author:
S.L. Stebbings
Author:
M. Praeger
Author:
A.M. de Paula
Author:
C.A. Froud
Author:
R.T. Chapman
Author:
T.J. Butcher
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