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Wavelength-dependent loss measurements in polysilicon modified optical fibres

Wavelength-dependent loss measurements in polysilicon modified optical fibres
Wavelength-dependent loss measurements in polysilicon modified optical fibres
The recent advancements in on-chip silicon photonics has lead to the demonstration of a number of compact optoelectronic devices owing to the unique material properties of the semiconductor. Although to date most of the major advancements have been based on single-crystal silicon waveguides, lately there has been an increased interest in polycrystalline structures for integrated devices as the deposition process is easier, allowing for more design flexibility. As a photonics material, polysilicon offers good optical and electronic properties but it is typically associated with large losses due to scattering off grain boundaries and surface imperfections at the corecladding interface
Lagonigro, L.
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Healy, N.V.
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Sparks, J.R.
40565a13-0809-4674-aa8e-9e6f4ba044d1
Baril, N.F.
f5d317cc-48d8-4be0-8f08-5385e700f8bb
Sazio, P.J.A.
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Badding, J.V.
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Peacock, A.C.
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Lagonigro, L.
c3bbb5f9-e81b-4565-970b-49c0e0bfd583
Healy, N.V.
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Sparks, J.R.
40565a13-0809-4674-aa8e-9e6f4ba044d1
Baril, N.F.
f5d317cc-48d8-4be0-8f08-5385e700f8bb
Sazio, P.J.A.
0d6200b5-9947-469a-8e97-9147da8a7158
Badding, J.V.
940f7adb-73df-4f8a-9c46-e47f5425fef0
Peacock, A.C.
685d924c-ef6b-401b-a0bd-acf1f8e758fc

Lagonigro, L., Healy, N.V., Sparks, J.R., Baril, N.F., Sazio, P.J.A., Badding, J.V. and Peacock, A.C. (2009) Wavelength-dependent loss measurements in polysilicon modified optical fibres At CLEO/Europe-EQEC. 14 - 19 Jun 2009. (doi:10.1109/CLEOE-EQEC.2009.5196515).

Record type: Conference or Workshop Item (Paper)

Abstract

The recent advancements in on-chip silicon photonics has lead to the demonstration of a number of compact optoelectronic devices owing to the unique material properties of the semiconductor. Although to date most of the major advancements have been based on single-crystal silicon waveguides, lately there has been an increased interest in polycrystalline structures for integrated devices as the deposition process is easier, allowing for more design flexibility. As a photonics material, polysilicon offers good optical and electronic properties but it is typically associated with large losses due to scattering off grain boundaries and surface imperfections at the corecladding interface

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Published date: 14 June 2009
Venue - Dates: CLEO/Europe-EQEC, 2009-06-14 - 2009-06-19

Identifiers

Local EPrints ID: 78961
URI: http://eprints.soton.ac.uk/id/eprint/78961
PURE UUID: c087fc06-e4b4-4edf-b4be-17992a9b03ae
ORCID for P.J.A. Sazio: ORCID iD orcid.org/0000-0002-6506-9266
ORCID for A.C. Peacock: ORCID iD orcid.org/0000-0002-1940-7172

Catalogue record

Date deposited: 17 Mar 2010
Last modified: 18 Jul 2017 23:20

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Contributors

Author: L. Lagonigro
Author: N.V. Healy
Author: J.R. Sparks
Author: N.F. Baril
Author: P.J.A. Sazio ORCID iD
Author: J.V. Badding
Author: A.C. Peacock ORCID iD

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