Wavelength-dependent loss measurements in polysilicon modified optical fibres

Lagonigro, L., Healy, N.V., Sparks, J.R., Baril, N.F., Sazio, P.J.A., Badding, J.V. and Peacock, A.C. (2009) Wavelength-dependent loss measurements in polysilicon modified optical fibres At CLEO/Europe-EQEC. 14 - 19 Jun 2009. (doi:10.1109/CLEOE-EQEC.2009.5196515).


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The recent advancements in on-chip silicon photonics has lead to the demonstration of a number of compact optoelectronic devices owing to the unique material properties of the semiconductor. Although to date most of the major advancements have been based on single-crystal silicon waveguides, lately there has been an increased interest in polycrystalline structures for integrated devices as the deposition process is easier, allowing for more design flexibility. As a photonics material, polysilicon offers good optical and electronic properties but it is typically associated with large losses due to scattering off grain boundaries and surface imperfections at the corecladding interface

Item Type: Conference or Workshop Item (Paper)
Digital Object Identifier (DOI): doi:10.1109/CLEOE-EQEC.2009.5196515
Venue - Dates: CLEO/Europe-EQEC, 2009-06-14 - 2009-06-19
Related URLs:
ePrint ID: 78961
Date :
Date Event
14 June 2009Published
Date Deposited: 17 Mar 2010
Last Modified: 18 Apr 2017 20:18
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/78961

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