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Wavelength-dependent loss measurements in polysilicon modified optical fibres

Lagonigro, L., Healy, N.V., Sparks, J.R., Baril, N.F., Sazio, P.J.A., Badding, J.V. and Peacock, A.C. (2009) Wavelength-dependent loss measurements in polysilicon modified optical fibres At CLEO/Europe-EQEC. 14 - 19 Jun 2009. (doi:10.1109/CLEOE-EQEC.2009.5196515).

Record type: Conference or Workshop Item (Paper)


The recent advancements in on-chip silicon photonics has lead to the demonstration of a number of compact optoelectronic devices owing to the unique material properties of the semiconductor. Although to date most of the major advancements have been based on single-crystal silicon waveguides, lately there has been an increased interest in polycrystalline structures for integrated devices as the deposition process is easier, allowing for more design flexibility. As a photonics material, polysilicon offers good optical and electronic properties but it is typically associated with large losses due to scattering off grain boundaries and surface imperfections at the corecladding interface

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Published date: 14 June 2009
Venue - Dates: CLEO/Europe-EQEC, 2009-06-14 - 2009-06-19


Local EPrints ID: 78961
PURE UUID: c087fc06-e4b4-4edf-b4be-17992a9b03ae
ORCID for P.J.A. Sazio: ORCID iD
ORCID for A.C. Peacock: ORCID iD

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Date deposited: 17 Mar 2010
Last modified: 18 Jul 2017 23:20

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Author: L. Lagonigro
Author: N.V. Healy
Author: J.R. Sparks
Author: N.F. Baril
Author: P.J.A. Sazio ORCID iD
Author: J.V. Badding
Author: A.C. Peacock ORCID iD

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