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In vacuo measurement of the sensitivity limit of planar Bragg sensors

Record type: Conference or Workshop Item (Paper)

We present the direct measurement and modeling of the sensitivity limit of an integrated refractive index sensor for the detection of molecular monolayers. Direct UV writing can be used to fabricate a wide range of integrated optical devices particularly Bragg gratings. These Bragg gratings are inherently sensitive to temperature and strain.

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Citation

Parker, R.M., Gates, J.C., Sessions, N.P., Kundys, D.O., Gawith, C.B.E., Grossel, M.C. and Smith, P.G.R. (2009) In vacuo measurement of the sensitivity limit of planar Bragg sensors At Conference on Lasers and Electro-optics - European Quantum Electronics Conference (CLEO/Europe-EQEC 2009). 14 - 19 Jun 2009. 1 pp. (doi:10.1109/CLEOE-EQEC.2009.5196282).

More information

Published date: June 2009
Venue - Dates: Conference on Lasers and Electro-optics - European Quantum Electronics Conference (CLEO/Europe-EQEC 2009), 2009-06-14 - 2009-06-19

Identifiers

Local EPrints ID: 78998
URI: http://eprints.soton.ac.uk/id/eprint/78998
PURE UUID: 4e42b853-daee-42b6-a63b-626e81148a54
ORCID for J.C. Gates: ORCID iD orcid.org/0000-0001-8671-5987
ORCID for C.B.E. Gawith: ORCID iD orcid.org/0000-0002-3502-3558
ORCID for M.C. Grossel: ORCID iD orcid.org/0000-0001-7469-6854

Catalogue record

Date deposited: 18 Mar 2010
Last modified: 18 Jul 2017 23:19

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Contributors

Author: R.M. Parker
Author: J.C. Gates ORCID iD
Author: N.P. Sessions
Author: D.O. Kundys
Author: C.B.E. Gawith ORCID iD
Author: M.C. Grossel ORCID iD
Author: P.G.R. Smith

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