In vacuo measurement of the sensitivity limit of planar Bragg sensors


Parker, R.M., Gates, J.C., Sessions, N.P., Kundys, D.O., Gawith, C.B.E., Grossel, M.C. and Smith, P.G.R. (2009) In vacuo measurement of the sensitivity limit of planar Bragg sensors At Conference on Lasers and Electro-optics - European Quantum Electronics Conference (CLEO/Europe-EQEC 2009). 14 - 19 Jun 2009. 1 pp. (doi:10.1109/CLEOE-EQEC.2009.5196282).

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Description/Abstract

We present the direct measurement and modeling of the sensitivity limit of an integrated refractive index sensor for the detection of molecular monolayers. Direct UV writing can be used to fabricate a wide range of integrated optical devices particularly Bragg gratings. These Bragg gratings are inherently sensitive to temperature and strain.

Item Type: Conference or Workshop Item (Paper)
Digital Object Identifier (DOI): doi:10.1109/CLEOE-EQEC.2009.5196282
Venue - Dates: Conference on Lasers and Electro-optics - European Quantum Electronics Conference (CLEO/Europe-EQEC 2009), 2009-06-14 - 2009-06-19
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ePrint ID: 78998
Date :
Date Event
June 2009Published
Date Deposited: 18 Mar 2010
Last Modified: 18 Apr 2017 20:17
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/78998

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