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In vacuo measurement of the sensitivity limit of planar Bragg sensors

In vacuo measurement of the sensitivity limit of planar Bragg sensors
In vacuo measurement of the sensitivity limit of planar Bragg sensors
We present the direct measurement and modeling of the sensitivity limit of an integrated refractive index sensor for the detection of molecular monolayers. Direct UV writing can be used to fabricate a wide range of integrated optical devices particularly Bragg gratings. These Bragg gratings are inherently sensitive to temperature and strain.
Parker, R.M.
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Gates, J.C.
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Sessions, N.P.
ee737092-56b4-403e-a2f9-764e07e42625
Kundys, D.O.
047114f1-6b6e-47ee-ba71-2c59d594a197
Gawith, C.B.E.
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Grossel, M.C.
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Smith, P.G.R.
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Parker, R.M.
f81eb20a-6333-46e5-afb8-2413caa81f3e
Gates, J.C.
b71e31a1-8caa-477e-8556-b64f6cae0dc2
Sessions, N.P.
ee737092-56b4-403e-a2f9-764e07e42625
Kundys, D.O.
047114f1-6b6e-47ee-ba71-2c59d594a197
Gawith, C.B.E.
926665c0-84c7-4a1d-ae19-ee6d7d14c43e
Grossel, M.C.
403bf3ff-6364-44e9-ab46-52d84c6f0d56
Smith, P.G.R.
8979668a-8b7a-4838-9a74-1a7cfc6665f6

Parker, R.M., Gates, J.C., Sessions, N.P., Kundys, D.O., Gawith, C.B.E., Grossel, M.C. and Smith, P.G.R. (2009) In vacuo measurement of the sensitivity limit of planar Bragg sensors. Conference on Lasers and Electro-optics - European Quantum Electronics Conference (CLEO/Europe-EQEC 2009). 14 - 19 Jun 2009. 1 pp . (doi:10.1109/CLEOE-EQEC.2009.5196282).

Record type: Conference or Workshop Item (Paper)

Abstract

We present the direct measurement and modeling of the sensitivity limit of an integrated refractive index sensor for the detection of molecular monolayers. Direct UV writing can be used to fabricate a wide range of integrated optical devices particularly Bragg gratings. These Bragg gratings are inherently sensitive to temperature and strain.

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Published date: June 2009
Venue - Dates: Conference on Lasers and Electro-optics - European Quantum Electronics Conference (CLEO/Europe-EQEC 2009), 2009-06-14 - 2009-06-19

Identifiers

Local EPrints ID: 78998
URI: https://eprints.soton.ac.uk/id/eprint/78998
PURE UUID: 4e42b853-daee-42b6-a63b-626e81148a54
ORCID for J.C. Gates: ORCID iD orcid.org/0000-0001-8671-5987
ORCID for C.B.E. Gawith: ORCID iD orcid.org/0000-0002-3502-3558
ORCID for M.C. Grossel: ORCID iD orcid.org/0000-0001-7469-6854

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Date deposited: 18 Mar 2010
Last modified: 20 Jul 2019 01:21

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