The effect of an electric field on the morphological stability of the crystal-melt interface of a binary alloy II. Joule heating and thermoelectric effects

Coriell, S.R., McFadden, G.B., Wheeler, A.A. and Hurle, D.T.J. (1989) The effect of an electric field on the morphological stability of the crystal-melt interface of a binary alloy II. Joule heating and thermoelectric effects. Journal of Crystal Growth, 94 (2), 334-346. (doi:10.1016/0022-0248(89)90006-7).

Abstract

We perform a fully time-dependent linear stability analysis of the morphological stability of a planar interface during directional solidification of a binary alloy at constant velocity in the presence of an electric field. We take into account electromigration of solute, Joule heating, and thermoelectric effects. This represents an extension of the simple model of Wheeler et al. in which the latter two effects were neglected. We find that for tin–bismuth and germanium–gallium alloys the influence of electromigration and differing electrical conductivities in each phase are the most important in determining the linear stability of the system, with the Peltier heat and Thomson effect the most significant of the thermoelectric effects, particularly at low velocities where an additional long wavelength instability may arise. Joule heating and Seebeck effects appear to be of lesser importance.

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