Fault Detection and Classification in Analogue Integrated Circuits using Robust Heteroscedastic Probabilistic Neural Networks


Yang, Z. R., Zwolinski, M. and Chalk, C.D. (1998) Fault Detection and Classification in Analogue Integrated Circuits using Robust Heteroscedastic Probabilistic Neural Networks. UNSPECIFIED

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Additional Information: 4th IEEE International Mixed Signal Testing Workshop Organisation: IEEE
Divisions: Faculty of Physical and Applied Science > Electronics and Computer Science > EEE
Item ID: 251851
Date Deposited: 12 Nov 1999
Last Modified: 02 Mar 2012 13:40
Contributors: Yang, Z. R. (Author)
Zwolinski, M. (Author)
Chalk, C.D. (Author)
Date: 1998
Additional Information: 4th IEEE International Mixed Signal Testing Workshop Organisation: IEEE
Status: Published
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/251851

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