Testing analog circuits by supply voltage variation and supply current monitoring
Kilic, Y. and Zwolinski, M. (1999) Testing analog circuits by supply voltage variation and supply current monitoring. UNSPECIFIED , 155-8.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Additional Information: | IEEE Custom Integrated Circuits Conference Organisation: IEEE |
| Divisions: | Faculty of Physical Sciences and Engineering > Electronics and Computer Science > EEE |
| Item ID: | 251856 |
| Date Deposited: | 12 Nov 1999 |
| Last Modified: | 26 Apr 2013 01:55 |
| Contributors: | Kilic, Y. (Author) Zwolinski, M. (Author) |
| Date: | 1999 |
| Additional Information: | IEEE Custom Integrated Circuits Conference Organisation: IEEE |
| Status: | Published |
| Further Information: | Google Scholar |
| ISI Citation Count: | 4 |
| URI: | http://eprints.soton.ac.uk/id/eprint/251856 |
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