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Testing analog circuits by supply voltage variation and supply current monitoring

Testing analog circuits by supply voltage variation and supply current monitoring
Testing analog circuits by supply voltage variation and supply current monitoring
155-8
Kilic, Y.
47444b82-52f5-48e8-b219-01009e81e0ea
Zwolinski, M.
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Kilic, Y.
47444b82-52f5-48e8-b219-01009e81e0ea
Zwolinski, M.
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0

Kilic, Y. and Zwolinski, M. (1999) Testing analog circuits by supply voltage variation and supply current monitoring. pp. 155-8 .

Record type: Conference or Workshop Item (Other)
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More information

Published date: 1999
Additional Information: IEEE Custom Integrated Circuits Conference Organisation: IEEE
Organisations: EEE

Identifiers

Local EPrints ID: 251856
URI: http://eprints.soton.ac.uk/id/eprint/251856
PURE UUID: c21de543-5482-4019-a983-1fc08ac73ee2
ORCID for M. Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 12 Nov 1999
Last modified: 15 Mar 2024 02:39

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Contributors

Author: Y. Kilic
Author: M. Zwolinski ORCID iD

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